A Wiener process model for accelerated degradation analysis considering measurement errors

2016 ◽  
Vol 65 ◽  
pp. 8-15 ◽  
Author(s):  
Junxing Li ◽  
Zhihua Wang ◽  
Xia Liu ◽  
Yongbo Zhang ◽  
Huimin Fu ◽  
...  
Keyword(s):  
Wiener Process ◽  
Measurement Errors ◽  
Process Model ◽  
Accelerated Degradation ◽  
Degradation Analysis

scholarly journals A novel Wiener process model with measurement errors for degradation analysis

2016 ◽  
Vol 18 (03) ◽  
pp. 396-405 ◽  
Author(s):  
Zhihua Wang ◽  
Junxing Li ◽  
Yongbo ZHANG ◽  
Huimin Fu ◽  
Chengrui Liu ◽  
...  
Keyword(s):  
Wiener Process ◽  
Measurement Errors ◽  
Process Model ◽  
Degradation Analysis

scholarly journals Degradation analysis on high-cycle bending fatigue for woven SiC/SiC composites based on Wiener process model

2021 ◽  
Vol 198 ◽  
pp. 109295
Author(s):  
Xi Liu ◽  
Rongqiao Wang ◽  
Dianyin Hu ◽  
Long Zhang ◽  
Gaoxiang Chen
Keyword(s):  
Wiener Process ◽  
Process Model ◽  
Bending Fatigue ◽  
Degradation Analysis ◽  
Sic Composites

scholarly journals Optimal Constant-Stress Accelerated Degradation Test Plans Using Nonlinear Generalized Wiener Process

2016 ◽  
Vol 2016 ◽  
pp. 1-11 ◽  
Author(s):  
Zhen Chen ◽  
Shuo Li ◽  
Ershun Pan
Keyword(s):  
Wiener Process ◽  
Measurement Errors ◽  
Constant Stress ◽  
Normal Operation ◽  
Test Duration ◽  
Accelerated Degradation ◽  
Stress Levels ◽  
Degradation Test ◽  
Accelerated Degradation Test ◽  
Generalized Wiener Process

Accelerated degradation test (ADT) has been widely used to assess highly reliable products’ lifetime. To conduct an ADT, an appropriate degradation model and test plan should be determined in advance. Although many historical studies have proposed quite a few models, there is still room for improvement. Hence we propose a Nonlinear Generalized Wiener Process (NGWP) model with consideration of the effects of stress level, product-to-product variability, and measurement errors for a higher estimation accuracy and a wider range of use. Then under the constraints of sample size, test duration, and test cost, the plans of constant-stress ADT (CSADT) with multiple stress levels based on the NGWP are designed by minimizing the asymptotic variance of the reliability estimation of the products under normal operation conditions. An optimization algorithm is developed to determine the optimal stress levels, the number of units allocated to each level, inspection frequency, and measurement times simultaneously. In addition, a comparison based on degradation data of LEDs is made to show better goodness-of-fit of the NGWP than that of other models. Finally, optimal two-level and three-level CSADT plans under various constraints and a detailed sensitivity analysis are demonstrated through examples in this paper.

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