Experimental investigation on the evolution of a conducted-EMI buck converter after thermal aging tests of the MOSFET

2015 ◽  
Vol 55 (9-10) ◽  
pp. 1391-1394 ◽  
Author(s):  
S. Douzi ◽  
M. Tlig ◽  
J. Ben Hadj Slama
Keyword(s):  
Experimental Investigation ◽  
Thermal Aging ◽  
Buck Converter ◽  
Conducted Emi

Conducted EMI evolution of power SiC MOSFET in a Buck converter after short-circuit aging tests

2018 ◽  
Vol 88-90 ◽  
pp. 219-224 ◽  
Author(s):  
Shawki Douzi ◽  
Moncef Kadi ◽  
Habib Boulzazen ◽  
Mohamed Tlig ◽  
Jaleleddine Ben Hadj Slama
Keyword(s):  
Short Circuit ◽  
Buck Converter ◽  
Circuit Aging ◽  
Conducted Emi

Conducted EMI Noise Prediction in DC Converter System for Electric Vehicle Application

2013 ◽  
Vol 325-326 ◽  
pp. 486-489 ◽  
Author(s):  
Zong Yu An ◽  
Quan Di Wang ◽  
Ya Li Zheng
Keyword(s):  
Equivalent Circuit ◽  
Buck Converter ◽  
Experimental Measurements ◽  
Noise Prediction ◽  
Frequency Range ◽  
Complex Approach ◽  
Proposed Model ◽  
Simulation And Experiment ◽  
Lumped Parameters ◽  
Conducted Emi

In this paper, common mode (CM) conducted perturbations are predicted and compared with experiments in a full-bridge transformer-isolated buck converter system, thanks to a complex approach based on experimental measurements and on the modeling of the complete equivalent circuit. Its different part are considered and represented by a circuit of lumped parameters. Simulation and experiment of CM emission in the conducted frequency range (150 kHz-30 MHz) are compared. It is shown that the CM emission in the system can be calculated by the proposed model, and experiment has successfully confirmed this approach.

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