Degradation analysis and current collapse imaging of AlGaN/GaN HEMTs by measurement of electric field-induced optical second-harmonic generation
2014 ◽
Vol 54
(9-10)
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pp. 2227-2231
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2015 ◽
2014 ◽
2013 ◽
Vol 561-562
◽
pp. 97-100
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