In situ high temperature creep deformation of micro-structure with metal film wire on flexible membrane using geometric phase analysis

2013 ◽  
Vol 53 (4) ◽  
pp. 652-657 ◽  
Author(s):  
Qinghua Wang ◽  
Satoshi Kishimoto ◽  
Huimin Xie ◽  
Zhanwei Liu ◽  
Xinhao Lou
Author(s):  
Jayhoon Chung ◽  
Guoda Lian ◽  
Lew Rabenberg

Abstract Since strain engineering plays a key role in semiconductor technology development, a reliable and reproducible technique to measure local strain in devices is necessary for process development and failure analysis. In this paper, geometric phase analysis of high angle annular dark field - scanning transmission electron microscope images is presented as an effective technique to measure local strains in the current node of Si based transistors.


2008 ◽  
Vol 41 (3) ◽  
pp. 035408 ◽  
Author(s):  
J Kioseoglou ◽  
G P Dimitrakopulos ◽  
Ph Komninou ◽  
Th Karakostas ◽  
E C Aifantis

2020 ◽  
Vol 2 (3) ◽  
pp. 1105-1114 ◽  
Author(s):  
Jocelyn T. L. Gamler ◽  
Alberto Leonardi ◽  
Xiahan Sang ◽  
Kallum M. Koczkur ◽  
Raymond R. Unocic ◽  
...  

Bimetallic nanocrystals with core@shell architectures are versatile particles. Geometric phase analysis of TEM images and atomistic simulations are coupled to reveal the lattice relaxation as a function of lattice mismatch and shell thickness.


2003 ◽  
Vol 9 (S02) ◽  
pp. 952-953
Author(s):  
C.L. Johnson ◽  
M.J. Hÿtch ◽  
P.R. Buseck

Author(s):  
Pamela Henderson ◽  
Jacek Komenda

The use of single crystal (SX) nickel-base superalloys will increase in the future with the introduction of SX blades into large gas turbines for base-load electricity production. Prolonged periods of use at high temperatures may cause creep deformation and the assessment of damage can give large financial savings. A number of techniques can be applied for life assessment, e.g. calculations based on operational data, non-destructive testing or material interrogation, but because of the uncertainties involved the techniques are often used in combination. This paper describes a material interrogation (metallographic) technique for creep strain assessment in SX alloys. Creep tests have been performed at 950°C on the SX alloy CMSX-4 and quantitative microstructural studies performed on specimens interrupted at various levels of strain. It was found that the strengthening γ′-particles, initially cuboidal in shape, coalesced to form large plates or rafts normal to the applied stress. The γ-matrix phase also formed plates. CMSX-4 contains ∼ 70 vol % γ′-particles and after creep deformation the microstructure turned itself inside out, i.e. the gamma “matrix” became the isolated phase surrounded by the γ′-“particles”. This can cause problems for computerised image analysis, which in this case, were overcome with the choice of a suitable measurement parameter. The rafts reached their maximum length before 2% strain, but continued to thicken with increasing strain. Although of different dimensions, the aspect ratios (length/thickness ratio) of the gamma-prime rafts and the gamma plates were similar at similar levels of strain, increasing from ∼1 at zero strain to a maximum of ∼3 at about 1–2 % strain. Analysis of microstructural measurements from rafting studies on SX alloys presented in the literature showed that the aspect ratios of the γ- and γ′-phases were similar and that at a temperature of 950–1000°C a maximum length/thickness ratio of about 2.5–3.5 is reached at 1 to 2% creep strain. Measurement of gamma-prime raft or (or gamma plate) dimensions on longitudinal sections of blades is thus a suitable method for high temperature creep damage assessment of SX alloys. This gives a considerable advantage over conventional Ni-base superalloys whose microstructures are usually very stable with respect to increasing creep strain.


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