Electrostatic discharge failure analysis of capacitive RF MEMS switches

2007 ◽  
Vol 47 (9-11) ◽  
pp. 1818-1822 ◽  
Author(s):  
J. Ruan ◽  
N. Nolhier ◽  
M. Bafleur ◽  
L. Bary ◽  
F. Coccetti ◽  
...  
Author(s):  
Ingrid De Wolf ◽  
Anne Jourdain ◽  
Ann Witvrouw ◽  
Paolo Fiorini ◽  
Harrie A. C. Tilmans ◽  
...  

Abstract In this paper we discuss reliability and failure analysis issues of RF-MEMS capacitive switches. We describe specific instrumentation and methods that can be used for testing and examination of these switches. These include SEM, AFM, SAM, static and dynamic optical investigation and electrical lifetime testing. Processing as well as testing and packaging issues are discussed.


2013 ◽  
Vol 53 (9-11) ◽  
pp. 1659-1662
Author(s):  
N. Torres Matabosch ◽  
F. Coccetti ◽  
M. Kaynak ◽  
B. Espana ◽  
B. Tillack ◽  
...  

2005 ◽  
Author(s):  
Afshin Ziaei ◽  
Thierry Dean ◽  
Jean-Philippe Polizzi

2019 ◽  
Vol 18 (1) ◽  
pp. 9-14
Author(s):  
Xiao L. Evans ◽  
H.S. Gamble ◽  
P.T. Baine ◽  
S.J.N. Mitchell ◽  
J. Montgomery ◽  
...  

2006 ◽  
Author(s):  
Afshin Ziaei ◽  
Thierry Dean ◽  
Yves Mancuso

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