Localization factor: A new parameter for the quantitative characterization of surface structure with atomic force microscopy (AFM)

Attila Bonyár; László Milán Molnár; Gábor Harsányi

doi:10.1016/j.micron.2011.09.005

Localization factor: A new parameter for the quantitative characterization of surface structure with atomic force microscopy (AFM)

Micron ◽

10.1016/j.micron.2011.09.005 ◽

2012 ◽

Vol 43 (2-3) ◽

pp. 305-310 ◽

Cited By ~ 17

Author(s):

Attila Bonyár ◽

László Milán Molnár ◽

Gábor Harsányi

Keyword(s):

Atomic Force Microscopy ◽

Surface Structure ◽

Quantitative Characterization ◽

Force Microscopy ◽

Localization Factor ◽

Atomic Force

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Quantitative Characterization of Obliquely Deposited Substrates of Gold by Atomic Force Microscopy: Influence of Substrate Topography on Anchoring of Liquid Crystals

Chemistry of Materials ◽

10.1021/cm9804822 ◽

1999 ◽

Vol 11 (3) ◽

pp. 612-623 ◽

Cited By ~ 42

Author(s):

Justin J. Skaife ◽

Nicholas L. Abbott

Keyword(s):

Atomic Force Microscopy ◽

Liquid Crystals ◽

Quantitative Characterization ◽

Force Microscopy ◽

Substrate Topography ◽

Atomic Force ◽

Influence Of Substrate

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Quantitative characterization of phase separation in the photoactive layer of polymer solar cells by the phase image of atomic force microscopy

Thin Solid Films ◽

10.1016/j.tsf.2015.01.009 ◽

2015 ◽

Vol 576 ◽

pp. 81-87 ◽

Cited By ~ 8

Author(s):

H.L. Gao ◽

X.W. Zhang ◽

J.H. Meng ◽

Z.G. Yin ◽

L.Q. Zhang ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Solar Cells ◽

Phase Separation ◽

Polymer Solar Cells ◽

Phase Image ◽

Quantitative Characterization ◽

Photoactive Layer ◽

Force Microscopy ◽

Atomic Force

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Quantitative characterization of second-phase particles by atomic force microscopy and scanning electron microscopy

Philosophical Magazine A ◽

10.1080/01418610208240053 ◽

2002 ◽

Vol 82 (13) ◽

pp. 2575-2589 ◽

Cited By ~ 6

Author(s):

B. Fruhstorfer ◽

V. Mohles ◽

R. Reichelt ◽

E. Nembach

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Atomic Force Microscopy ◽

Second Phase ◽

Quantitative Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Second Phase Particles ◽

Scanning Electron

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Quantitative characterization of the electrospun gelatin–chitosan nanofibers by coupling scanning electron microscopy and atomic force microscopy

Materials Letters ◽

10.1016/j.matlet.2012.03.044 ◽

2012 ◽

Vol 79 ◽

pp. 14-17 ◽

Cited By ~ 9

Author(s):

Shilu Wang ◽

Guoming Zhao

Keyword(s):

Electron Microscopy ◽

Scanning Electron Microscopy ◽

Atomic Force Microscopy ◽

Quantitative Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Electrospun Gelatin ◽

Scanning Electron

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Quantitative characterization of single-cell adhesion properties by atomic force microscopy using protein-functionalized microbeads

Journal of Molecular Recognition ◽

10.1002/jmr.2767 ◽

2018 ◽

Vol 32 (3) ◽

pp. e2767 ◽

Cited By ~ 3

Author(s):

Lionel Chièze ◽

Anthony Le Cigne ◽

Marie Meunier ◽

Alexandre Berquand ◽

Stéphane Dedieu ◽

...

Keyword(s):

Atomic Force Microscopy ◽

Cell Adhesion ◽

Single Cell ◽

Quantitative Characterization ◽

Adhesion Properties ◽

Force Microscopy ◽

Atomic Force

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The quantitative characterization of the dispersion state of single-walled carbon nanotubes using Raman spectroscopy and atomic force microscopy

Carbon ◽

10.1016/j.carbon.2008.06.046 ◽

2008 ◽

Vol 46 (12) ◽

pp. 1530-1534 ◽

Cited By ~ 21

Author(s):

Dokyung Yoon ◽

Jae-Boong Choi ◽

Chang-Soo Han ◽

Young-Jin Kim ◽

Seunghyun Baik

Keyword(s):

Carbon Nanotubes ◽

Raman Spectroscopy ◽

Atomic Force Microscopy ◽

Single Walled Carbon Nanotubes ◽

Quantitative Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Dispersion State ◽

Walled Carbon Nanotubes

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Characterization of polymer surface structure and surface mechanical behaviour by sum frequency generation surface vibrational spectroscopy and atomic force microscopy

Journal of Physics Condensed Matter ◽

10.1088/0953-8984/16/21/r02 ◽

2004 ◽

Vol 16 (21) ◽

pp. R659-R677 ◽

Cited By ~ 20

Author(s):

Aric Opdahl ◽

Telly S Koffas ◽

Ella Amitay-Sadovsky ◽

Joonyeong Kim ◽

Gabor A Somorjai

Keyword(s):

Atomic Force Microscopy ◽

Surface Structure ◽

Vibrational Spectroscopy ◽

Mechanical Behaviour ◽

Polymer Surface ◽

Sum Frequency Generation ◽

Sum Frequency ◽

Force Microscopy ◽

Atomic Force

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Quantitative characterization of adhesion and stiffness of corneal lens of Drosophila melanogaster using atomic force microscopy

Journal of the Mechanical Behavior of Biomedical Materials ◽

10.1016/j.jmbbm.2015.08.015 ◽

2016 ◽

Vol 53 ◽

pp. 161-173 ◽

Cited By ~ 9

Author(s):

A.L. Lavanya Devi ◽

Upendra Nongthomba ◽

M.S. Bobji

Keyword(s):

Atomic Force Microscopy ◽

Drosophila Melanogaster ◽

Quantitative Characterization ◽

Force Microscopy ◽

Atomic Force ◽

Corneal Lens

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Quantitative Characterization of Protein Nanostructures Using Atomic Force Microscopy

2007 29th Annual International Conference of the IEEE Engineering in Medicine and Biology Society ◽

10.1109/iembs.2007.4353874 ◽

2007 ◽

Cited By ~ 2

Author(s):

Ine Segers-Nolten ◽

Kees van der Werf ◽

Martijn van Raaij ◽

Vinod Subramaniam

Keyword(s):

Atomic Force Microscopy ◽

Quantitative Characterization ◽

Force Microscopy ◽

Atomic Force

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Quantitative characterization of biomolecular assemblies and interactions using atomic force microscopy

Methods ◽

10.1016/s1046-2023(02)00308-0 ◽

2003 ◽

Vol 29 (2) ◽

pp. 175-187 ◽

Cited By ~ 78

Author(s):

Y Yang

Keyword(s):

Atomic Force Microscopy ◽

Quantitative Characterization ◽

Force Microscopy ◽

Atomic Force

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