Automated Scanning Tunneling Microscope image analysis of Si (100):H 2×1 surfaces

2012 ◽  
Vol 98 ◽  
pp. 214-217 ◽  
Author(s):  
J.N. Randall ◽  
J.R. Von Ehr ◽  
J.B. Ballard ◽  
J.H.G. Owen ◽  
E. Fuchs
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