scholarly journals Room temperature low level formaldehyde sensor using spray deposited cerium oxide thin film

2020 ◽  
Author(s):  
D. Samson Daniel ◽  
Suhashini Ernest ◽  
S. Fairose
Keyword(s):  
Thin Film ◽  
Cerium Oxide ◽  
Room Temperature ◽  
Oxide Thin Film ◽  
Low Level

Pseudo n-type behaviour of nickel oxide thin film at room temperature towards ammonia sensing

2021 ◽  
Author(s):  
Kumar Haunsbhavi ◽  
Karuppiah Deva Arun Kumar ◽  
Paolo Mele ◽  
Omar M. Aldossary ◽  
Mohd Ubaidullah ◽  
...  
Keyword(s):  
Thin Film ◽  
Nickel Oxide ◽  
Room Temperature ◽  
Oxide Thin Film ◽  
Ammonia Sensing ◽  
Nickel Oxide Thin Film

The Composition-Dependent Color Evolution of Anodic Electrodeposited Cerium Oxide Thin Film

2014 ◽  
Vol 161 (12) ◽  
pp. D644-D650 ◽  
Author(s):  
Yang Yang ◽  
Yumeng Yang ◽  
Changsheng An ◽  
Zhongnian Yang ◽  
Xiaoqing Du ◽  
...  
Keyword(s):  
Thin Film ◽  
Cerium Oxide ◽  
Oxide Thin Film ◽  
Color Evolution

A New Buffering Layer of Photovoltaic Solar Cells

2012 ◽  
Vol 482-484 ◽  
pp. 394-397
Author(s):  
Ming Wei Li ◽  
Nan Hai Sun ◽  
Yun Wang Ge ◽  
Bo Lei Yao
Keyword(s):  
Thin Film ◽  
Solar Cells ◽  
Organic Solar Cells ◽  
Room Temperature ◽  
Acid Methyl Ester ◽  
Good Alternative ◽  
Oxide Thin Film ◽  
Nio Thin Film ◽  
Temperature Deposition ◽  
Photovoltaic Solar Cells

This paper presents a new buffering layer(nickle oxide thin film) of organic solar cells. Nickle Oxide(NiO) thin film is a good alternative of hole tansporting layer. We investigates the film from physical and electrical aspects, such as morphology, deposition temperature, thickness etc. We find that the optimum fabrication conditions are: room temperature deposition, 10nm of thickness, and 30% oxygen proportion. The device strcture is Anode/NiO/P3HT[regioregular of poly(3-hexylthiophene)]: PCBM[(6,6)-phenyl C61 butyric acid methyl ester] /Al. And the best power conversion efficiency of device we got with NiO buffering layer is 2.49%, which is hundred times of ones without NiO buffering layer.

Investigation of cerium oxide thin film thickness using THz spectroscopy for non-destructive measurement

2020 ◽  
Author(s):  
Subhash Nimanpure ◽  
Guruvandra Singh ◽  
Sudha Yadav ◽  
Preetam Singh ◽  
Girija Moona ◽  
...  
Keyword(s):  
Thin Film ◽  
Film Thickness ◽  
Cerium Oxide ◽  
Oxide Thin Film ◽  
Thz Spectroscopy ◽  
Thin Film Thickness ◽  
Destructive Measurement ◽  
Non Destructive
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