Stain etching of silicon with V2O5 and FeCl3: Effect of etching time on photoluminescence

2020 ◽  
Vol 26 ◽  
pp. 3193-3196
Author(s):  
Sakshi Juyal ◽  
Yogesh Kumar ◽  
Brijesh Prasad ◽  
Varij Panwar ◽  
Neeraj Dhiman ◽  
...  
Keyword(s):  
2018 ◽  
Author(s):  
Ong Pei Hoon ◽  
Ng Kiong Kay ◽  
Gwee Hoon Yen

Abstract Chemical etching is commonly used in exposing the die surface from die front-side and die backside because of its quick etching time, burr-free and stress-free. However, this technique is risky when performing copper lead frame etching during backside preparation on small and non-exposed die paddle package. The drawback of this technique is that the copper leads will be over etched by 65% Acid Nitric Fuming even though the device’s leads are protected by chemical resistance tape. Consequently, the device is not able to proceed to any other further electrical measurements. Therefore, we introduced mechanical preparation as an alternative solution to replace the existing procedure. With the new method, we are able to ensure the copper leads are intact for the electrical measurements to improve the effectiveness and accuracy of physical failure analysis.


2020 ◽  
Vol 1529 ◽  
pp. 032106
Author(s):  
Muna E. Raypah ◽  
Naser M. Ahmed ◽  
S.A.M Samsuri ◽  
Shahrom Mahmud

2011 ◽  
Vol 337 ◽  
pp. 59-62
Author(s):  
Xiang Hui Zhang ◽  
Ling Wang ◽  
Jian Ping Long

In the present investigation, diamond coating was deposited on fine grinding cemented carbide substrate by direct current arc discharge chemical vapor deposition. The effect of electrolytic etching time in the two-step electrochemical pretreatment process (firstly using electrolytic etching, and then using acid etching) on morphology and quality of the diamond coating were systemically studied. The surface morphology feature and quality of diamond coatings were characterized by means of Scanning Electron Microscope (SEM), laser Raman spectrometer respectively. The results showed that the electrolytic etching duration has distinctly effect on the quality and crystal features such as morphology, crystal type and grain size of diamond coating. It showed that as electrolytic current is direct current 3A, electrolytic etching time altering from 0.5 min to 7.5min, the surface morphology of diamond films gradually transition from microcrystalline cubic-octahedron to cauliflower type nanocluster, and further increase the electrolytic etching time, will lead to several negative effects on the quality and nucleation of the coatings which is not only retard the diamond nucleation, but also promote the formation of graphite.


2011 ◽  
Vol 364 ◽  
pp. 232-237 ◽  
Author(s):  
S.Y. Lim ◽  
M.M. Norani

Catalyst plays a crucial role in determining the characteristics of carbon nanotubes (CNTs) produced by using thermal catalytic chemical vapor deposition (CVD). It is essential to investigate how the catalyst preparation affects the characteristics of CNTs because certain application demands specific size for optimum performance. This study reports the effect of the types of catalyst and the duration of the catalyst pre-treatment (wet etching time, dry etching time and ball milling) on the diameter of CNTs. The synthesized CNTs samples were characterized by scanning and transmission electron microscopy and Raman spectroscopy. Wet etching (2M hydrofluoric acid) time was varied from 1 to 2.5 hrs and the diameter range was found to be in the range of 23 to 52 nm. The diameter range for CNTs produced for 3 hrs and 5 hrs of dry etching treatment (with ammonia gas) are 38 to 51 nm and 23 to 48 nm, respectively. The diameter size of CNTs produced using Ni (14 to 25 nm) was found to be smaller than Fe (38 to 51 nm). There is a significant decrease in the diameter of CNTs by prolonging the wet etching period. Shorter and curly shaped CNTs can also be obtained by using Ni as the catalyst. Keywords: chemical vapor deposition, carbon nanotubes, catalyst pretreatment


1997 ◽  
Vol 11 (4) ◽  
pp. 395-402
Author(s):  
J.J. Ten Bosch ◽  
J. De Vries ◽  
M.H. Van Der Veen

XPS, or ESCA, measures the atomic concentration in the outermost layers of the sample. The surface is often etched with Ar+-ions before any measurement. We investigated the role thereof on XPS measurements of root dentin. Nine slices were cut from premolars. Slices were ground or broken. XPS was measured before etching. Six samples were then subjected to Ar+-ion etching (10 kV ions, 0.25 μA/mm2). A gold sample was also included. Relative concentrations of N and C decreased with etching time, while 0, P, and Ca increased. N and C curves were analyzed assuming a sum of two exponential decays and a final level. On average, τ1 = 20 sec for C and 17 sec for N. On average, τ2 = 278 sec for C and 350 sec for N. No differences between differently prepared samples were apparent. The gold sample showed a single decay to noise for C and N, with τ1 = 8 and 7 sec, respectively. We conclude that two decay processes are present, due to gas removal and to the removal of organic material from the dentin matrix, respectively. Thus, true values can be obtained by extrapolation to t = 0 of only the data obtained by summing the slow decay and the final level.


2017 ◽  
Vol 79 (7) ◽  
Author(s):  
Shazatul Akmaliah Mior Shahidin ◽  
Nor Akmal Fadil ◽  
Mohd Zamri Yusop ◽  
Mohd Nasir Tamin ◽  
Saliza Azlina Osman

Metallic coatings, such as copper films can be easily deposited on semiconductor materials like silicon wafer without prior surface pre-treatment using the electroless process. However, the adhesion of the copper film can be very weak and can easily peels off. In this study, the effect of etching in hydrofluoric acid solution as a surface pre-treatment prior to electroless plating on silicon wafer was studied. The etching time in hydrofluoric acid was varied at 1, 3 and 5 minutes in order to investigate the adhesion behaviour of the coating layer. The surface morphology of the electroless plated samples was observed using a field emission scanning electron microscope (FESEM) and the coating thickness was measured using cross sectional analysis. The results showed that longer etching time (5 minutes) produced thicker Cu deposits (8.5μm) than 1 minute etching time (5μm). In addition, by increasing the etching time, the mechanical bonding between the copper film and the substrate is improved.


Author(s):  
Martin Ehrhardt ◽  
Pierre Lorenz ◽  
Jens Bauer ◽  
Robert Heinke ◽  
Mohammad Afaque Hossain ◽  
...  

AbstractHigh-quality, ultra-precise processing of surfaces is of high importance for high-tech industry and requires a good depth control of processing, a low roughness of the machined surface and as little as possible surface and subsurface damage but cannot be realized by laser ablation processes. Contrary, electron/ion beam, plasma processes and dry etching are utilized in microelectronics, optics and photonics. Here, we have demonstrated a laser-induced plasma (LIP) etching of single crystalline germanium by an optically pumped reactive plasma, resulting in high quality etching. A Ti:Sapphire laser (λ = 775 nm, EPulse/max. = 1 mJ, t = 150 fs, frep. = 1 kHz) has been used, after focusing with a 60 mm lens, for igniting a temporary plasma in a CF4/O2 gas at near atmospheric pressure. Typical etching rate of approximately ~ 100 nm / min and a surface roughness of less than 11 nm rms were found. The etching results were studied in dependence on laser pulse energy, etching time, and plasma – surface distance. The mechanism of the etching process is expected to be of chemical nature by the formation of volatile products from the chemical reaction of laser plasma activated species with the germanium surface. This proposed laser etching process can provide new processing capabilities of materials for ultra—high precision laser machining of semiconducting materials as can applied for infrared optics machining.


Sign in / Sign up

Export Citation Format

Share Document