In-situ electrical resistance measurement for determining minimum continuous thickness of Sn films by DC magnetron sputtering

2012 ◽  
Vol 73 ◽  
pp. 62-64 ◽  
Author(s):  
Se-Hun Kwon ◽  
Na-Hyun Kwon ◽  
Pung-Keun Song ◽  
Kwun Nam Hui ◽  
Kwan-San Hui ◽  
...  
Keyword(s):  
Magnetron Sputtering ◽  
Electrical Resistance ◽  
Resistance Measurement ◽  
Electrical Resistance Measurement ◽  
Dc Magnetron Sputtering

In-situ electrical resistance measurement of the selenization process in the CuInGa–Se system

2010 ◽  
Vol 519 (1) ◽  
pp. 244-250 ◽  
Author(s):  
Wei Liu ◽  
Jian-Guo Tian ◽  
Qing He ◽  
Feng-Yan Li ◽  
Chang-Jian Li ◽  
...  
Keyword(s):  
Electrical Resistance ◽  
Resistance Measurement ◽  
Electrical Resistance Measurement ◽  
Selenization Process

Investigation of the Interaction between Perovskite Films with Moisture via in Situ Electrical Resistance Measurement

2015 ◽  
Vol 7 (45) ◽  
pp. 25113-25120 ◽  
Author(s):  
Long Hu ◽  
Gang Shao ◽  
Tao Jiang ◽  
Dengbing Li ◽  
Xinlin Lv ◽  
...  
Keyword(s):  
Electrical Resistance ◽  
Resistance Measurement ◽  
Electrical Resistance Measurement

DECOMPOSITION KINETICS OF Cu-10aT%Co ALLOY STUDIED BY IN-SITU ELECTRICAL RESISTANCE MEASUREMENT

2002 ◽  
Vol 16 (01n02) ◽  
pp. 137-143
Author(s):  
P. PENG ◽  
Z. H. JIN ◽  
K. LU ◽  
Z. Q. HU
Keyword(s):  
Electrical Resistance ◽  
Measurement Method ◽  
Resistance Measurement ◽  
Aged Alloy ◽  
Electrical Resistance Measurement ◽  
X Ray Diffraction ◽  
Decomposition Processes ◽  
Rapidly Solidified ◽  
Kinetics Of

The spinodal decomposition processes in the rapidly solidified Cu-10aT%Co alloy aged at several temperatures have been investigated using an in-situ electrical resistance measurement method combining a slowly scanning x-ray diffraction technique. Based on the Cahn-Hilliard theory, the time-dependences of amplification factor of the concentration modulation R(β) at different aging temperatures were calculated, and the Co atomic concentration of Co-rich region and Co-depleted region in the aged alloy were also deduced. The results showed that the evolution of composition modulation in microstructure in Cu-10aT%Co alloy can be monitored and characterized by an in-situ electrical resistance measurement method if only the degree of phase decomposition at some aging temperature and aging time had been previously deteced.

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