Determination of structural and magnetic properties in directionally solidified Ni-Mn-Ga rod with an axial compositional variation

2017 ◽  
Vol 134 ◽  
pp. 469-475 ◽  
Author(s):  
Yanchao Dai ◽  
Long Hou ◽  
Yves Fautrelle ◽  
Zongbin Li ◽  
Claude Esling ◽  
...  
Author(s):  
Yury Khaydukov ◽  
Olaf Soltwedel ◽  
Thomas Keller

The high resolution neutron/ X-ray contrast reflectometer NREX, operated by the Max Planck Institute for Solid State Research, is designed for the determination of structural and magnetic properties of surfaces, interfaces, and thin film systems.


Author(s):  
Vinayak P. Dravid ◽  
M.R. Notis ◽  
C.E. Lyman

The concept of interfacial width is often invoked in many materials science phenomena which relate to the structure and properties of internal interfaces. The numerical value of interface width is an important input parameter in diffusion equations, sintering theories as well as in many electronic devices/processes. Most often, however, this value is guessed rather than determined or even estimated. In this paper we present a method of determining the effective structural and electronic- structural width of interphase interfaces using low- and core loss fine structure effects in EELS spectra.The specimens used in the study were directionally solidified eutectics (DSEs) in the system; NiO-ZrO2(CaO), NiO-Y2O3 and MnO-ZrO2(ss). EELS experiments were carried out using a VG HB-501 FE STEM and a Hitachi HF-2000 FE TEM.


1979 ◽  
Vol 40 (C5) ◽  
pp. C5-206-C5-208 ◽  
Author(s):  
W. J. James ◽  
K. Hardman ◽  
W. Yelon ◽  
B. Kebe

1988 ◽  
Vol 49 (C8) ◽  
pp. C8-153-C8-154
Author(s):  
J. G. Booth ◽  
R. M. Mankikar ◽  
A. S. Saleh

2020 ◽  
Author(s):  
Jash Raval ◽  
Kailas Patole ◽  
Sakina Kachwala ◽  
Aarjav Sanghvi ◽  
Umesh Shinde

2019 ◽  
Vol 784 ◽  
pp. 794-799 ◽  
Author(s):  
G. Ziółkowski ◽  
A. Chrobak ◽  
J. Klimontko ◽  
K. Granek ◽  
D. Chrobak

Sign in / Sign up

Export Citation Format

Share Document