Electronic and structural changes induced by irradiation or annealing in pulsed laser deposited As50Se50 films. An XPS and UPS study

2007 ◽  
Vol 68 (5-6) ◽  
pp. 906-910 ◽  
Author(s):  
M. Kalyva ◽  
A. Siokou ◽  
S.N. Yannopoulos ◽  
P. Ne˘mec ◽  
M. Frumar
Keyword(s):  
Structural Changes ◽  
Pulsed Laser

Microraman Study of Laser Ablated Gaas

1994 ◽  
Vol 354 ◽  
Author(s):  
C. García ◽  
J. Jiménez ◽  
A.C. Prieto ◽  
J. Ramos ◽  
L.F. Sanz
Keyword(s):  
Chemical Composition ◽  
Structural Changes ◽  
Pulsed Laser ◽  
Optical Interferometry ◽  
Laser Beams ◽  
Surface Inspection ◽  
Dopant Distribution ◽  
Microraman Spectroscopy

AbstractMorphologic and structural changes induced by UV pulsed laser beams on GaAs are studied by means of surface inspection (optical interferometry) and MicroRaman spectroscopy. Crystal order and chemical composition (dopant distribution ) are shown to be changed by the ablation.

scholarly journals Low Energy Electron Diffraction During Pulsed Laser Annealing: A Time Resolved Surface Structural Study

1983 ◽  
Vol 23 ◽  
Author(s):  
R. S. Becker ◽  
G. S. Higashi ◽  
J. A. Golovchenko
Keyword(s):  
Electron Diffraction ◽  
Structural Changes ◽  
Laser Annealing ◽  
Pulsed Laser ◽  
Low Energy ◽  
Energy Electron ◽  
Time Resolved ◽  
Low Energy Electron Diffraction ◽  
Pulsed Laser Annealing ◽  
Low Energy Electron

ABSTRACTNanosecond structural changes in a crystal lattice during pulsed laser annealing have been measured using time-resolved Low Energy Electron Diffraction (LEED). LEED is both structure and surface (∼ 10Å) sensitive. Lattice temperatures can be extracted from Debye-Waller like extinction coefficients. Combining these with nanosecond time resolution provides a surface probe for short-time dynamical processes. The technique is used to observe the time evolution of a Ge(l11) surface during pulsed laser annealing. The results demonstrate rapid formation of a liquid layer and subsequent surface recrystallization and cooling.

Optimization of the Fabrication Parameters of PZT 52/48 Thin Films by Pulsed Laser Ablation

2006 ◽  
Vol 514-516 ◽  
pp. 1353-1357 ◽  
Author(s):  
José R. A. Fernandes ◽  
Ednan Joanni ◽  
Raluca Savu
Keyword(s):  
Thin Films ◽  
Deposition Temperature ◽  
Structural Changes ◽  
Ferroelectric Properties ◽  
Strong Dependence ◽  
Michelson Interferometer ◽  
Pulsed Laser ◽  
Processing Parameters ◽  
Deposition Pressure ◽  
Pzt Films

Thin films of PbZr0,52Ti0,48O3 (PZT) for applications in piezoelectric actuators were deposited by the pulsed laser deposition technique (PLD) over Pt/Ti/SiO2/Si substrates. The effect of different electrode and PZT deposition and processing conditions on the ferroelectric and piezoelectric properties of the devices was investigated. X-Ray diffraction results showed that the deposition temperature for the electrodes had a strong influence on the PZT orientation; the increase in the electrode deposition temperature changes the PZT orientation from random or (111) to (001) depending also on PZT deposition pressure. From scanning electron microscope (SEM) pictures one could also observe that the deposition pressure affects the porosity of the PZT films, which increases with the pressure above 1×10-1 mbar for films deposited at room temperature. The measurement of the ferroelectric hysteresis curves confirmed that the structural changes induced by different processing parameters affected the ferroelectric properties of the material. The best ferroelectric properties including fatigue endurance were obtained for electrodes made at high temperature and for PZT deposited at 2×10-2 mbar and heat treated at 675°C for 30 minutes in an oxygen atmosphere. The piezoelectric coefficient d33, measured using a Michelson interferometer, had values in the range between 20 and 60 pm/V, and showed a strong dependence on the thickness of the PZT films.

Nano-scale annealing-induced structural changes in As-rich pulsed laser deposited AsxSe100−x films studied by XPS

2006 ◽  
Vol 352 (9-20) ◽  
pp. 1520-1524 ◽  
Author(s):  
A. Siokou ◽  
M. Kalyva ◽  
S.N. Yannopoulos ◽  
P. Němec ◽  
M. Frumar
Keyword(s):  
Structural Changes ◽  
Pulsed Laser ◽  
Nano Scale

Analytical Jet Spectroscopy of Tyrosine and its Analogs Using a Pulsed Laser Desorption Volatilization Method

1988 ◽  
Vol 42 (3) ◽  
pp. 418-424 ◽  
Author(s):  
Liang Li ◽  
David M. Lubman
Keyword(s):  
Structural Changes ◽  
Electronic Spectroscopy ◽  
Supersonic Jet ◽  
Pulsed Laser ◽  
Laser Desorption ◽  
Ultracold Molecules ◽  
Two Photon ◽  
Biological Compounds ◽  
Supersonic Jet Expansion ◽  
Photon Ionization

Pulsed laser desorption is used as a means of volatilizing nonvolatile and thermally labile molecules for entrainment into a supersonic jet expansion. The jet expansion provides ultracold molecules whose sharp spectral features are probed by resonant two-photon ionization spectroscopy in a time-of-flight mass spectrometer. Such jet-cooled spectra are demonstrated for tyrosine and related structural analogs. Despite the similarity between these tyrosine-based compounds, electronic spectroscopy is shown to be a sensitive probe of small structural changes in these related biological compounds.

scholarly journals Laser-Induced Structural Modification in Calcium Aluminosilicate Glasses Using Molecular Dynamic Simulations

2021 ◽  
Author(s):  
Sean Locker ◽  
Sushmit Goyal ◽  
Matt McKenzie ◽  
Craig Ungaro ◽  
SK Sundaram
Keyword(s):  
Structural Changes ◽  
Laser Energy ◽  
Pulsed Laser ◽  
Silica Content ◽  
Fictive Temperature ◽  
Dynamic Simulations ◽  
Oxide Systems ◽  
Aluminosilicate Glasses ◽  
Calcium Aluminosilicate ◽  
High Silica

Abstract Glass structures of multicomponent oxide systems (CaO-Al2O3-SiO2) are studied using a simulated pulsed laser with molecular dynamics. The short- and intermediate-range order structures revealed a direct correlation between the transformation of Al(IV) to Al(V), regions of increased density following laser processing, inherent reduction in the average T-O-T (T = Al, Si) angle, and associated elongation of the T-O bonding distance. Variable laser pulse energies were simulated across calcium aluminosilicate glasses with high silica content (50-80%) to identify densification trends attributed to composition and laser energy. High-intensity pulsed laser effects on fictive temperature and shockwave promotion are discussed in detail for their role in glass densification. Laser-induced structural changes are found to be highly dependent on pulse energy and glass chemistry.

scholarly journals STRUCTURAL CHANGES IN PULSED LASER ABLATED CuInSe2 COMPOUND STRUKTURĀLĀS IZMAIŅAS IMPULSA LĀZERA ABLĒTAJĀ CuInSe2 SAVIENOJUMĀ

2013 ◽  
Vol 50 (6) ◽  
pp. 54-60
Author(s):  
A. Ogurcovs ◽  
V. Gerbreders ◽  
E. Tamanis ◽  
E. Sledevskis ◽  
A. Gerbreders
Keyword(s):  
Particle Size ◽  
Structural Changes ◽  
Pulsed Laser ◽  
Pulsed Laser Ablation ◽  
Xrd Analysis ◽  
Spherical Particles ◽  
Nonlinear Relationship ◽  
Temperature Synthesis ◽  
High Temperature Synthesis ◽  
Average Size

Abstract CuInSe2 (CISe) compound was produced by high-temperature synthesis. After mechanical milling, the average CISe particle size decreased to 10μm. The authors study structural changes of the compound after ablation in liquid by a 1064 nm pulsed laser. The SEM examination indicated the presence of spherical particles with the average size of ~ 450 nm. A nonlinear relationship was established between the laser radiation dose and the quantity of spherical particles. The XRD analysis has shown an improvement in the CISe crystalline structure and the absence of significant changes in its stoichiometry. The 3 μm thick experimental CISe samples were screen-printed on planar Ni electrodes, and improvement also was revealed in their photosensitivity. The conclusion is that the pulsed-laser ablation can be applied to chalcopyrite structures like CISe without destruction of their initial properties.

Some structural changes in cellulose under the action of pulsed laser radiation

1977 ◽  
Vol 26 (4) ◽  
pp. 495-497
Author(s):  
R. G. Zhbankov ◽  
N. V. Ivanova ◽  
N. I. Insarova ◽  
E. V. Korolik ◽  
A. N. Chumakov
Keyword(s):  
Laser Radiation ◽  
Structural Changes ◽  
Pulsed Laser ◽  
Pulsed Laser Radiation

Correlation of compositional and structural changes during pulsed laser deposition of tantalum oxide films

2004 ◽  
Vol 453-454 ◽  
pp. 245-250 ◽  
Author(s):  
Zs Geretovszky ◽  
T Szörényi ◽  
J.-P Stoquert ◽  
I.W Boyd
Keyword(s):  
Pulsed Laser Deposition ◽  
Structural Changes ◽  
Tantalum Oxide ◽  
Oxide Films ◽  
Pulsed Laser ◽  
Laser Deposition
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