The dielectric function of Mgy NiHx thin films ()

2007 ◽  
Vol 430 (1-2) ◽  
pp. 13-18 ◽  
Author(s):  
W. Lohstroh ◽  
R.J. Westerwaal ◽  
J.L.M. van Mechelen ◽  
H. Schreuders ◽  
B. Dam ◽  
...  
Keyword(s):  
Thin Films ◽  
Dielectric Function

Infrared dielectric function and vibrational modes of pentacene thin films

2004 ◽  
Vol 84 (2) ◽  
pp. 200-202 ◽  
Author(s):  
M. Schubert ◽  
C. Bundesmann ◽  
G. Jacopic ◽  
H. Maresch ◽  
H. Arwin
Keyword(s):  
Thin Films ◽  
Dielectric Function ◽  
Vibrational Modes

Characterization of dielectric function for metallic thin films based on ellipsometric parameters and reflectivity

2019 ◽  
Vol 94 (8) ◽  
pp. 085802 ◽  
Author(s):  
Jiamin Liu ◽  
Jianbin Lin ◽  
Hao Jiang ◽  
Honggang Gu ◽  
Xiuguo Chen ◽  
...  
Keyword(s):  
Thin Films ◽  
Dielectric Function ◽  
Metallic Thin Films

Dielectric function of zinc oxide thin films in a broad spectral range

2014 ◽  
Vol 571 ◽  
pp. 593-596 ◽  
Author(s):  
E. Mammadov ◽  
N. Naghavi ◽  
Z. Jehl ◽  
G. Renou ◽  
T. Tiwald ◽  
...  
Keyword(s):  
Thin Films ◽  
Zinc Oxide ◽  
Dielectric Function ◽  
Spectral Range ◽  
Oxide Thin Films ◽  
Broad Spectral Range

On the microstructure, chemistry, and dielectric function of BaTiO3 MOCVD thin films

1994 ◽  
Vol 9 (2) ◽  
pp. 426-430 ◽  
Author(s):  
V.P. Dravid ◽  
H. Zhang ◽  
L.A. Wills ◽  
B.W. Wessels
Keyword(s):  
Thin Films ◽  
Electron Diffraction ◽  
Dielectric Function ◽  
Lattice Strain ◽  
Chemical Vapor ◽  
Convergent Beam Electron Diffraction ◽  
Organic Chemical ◽  
Beam Electron ◽  
Spatially Resolved ◽  
Convergent Beam

Thin films of BaTiO3 deposited on (100)LaAlO3 substrate by metal-organic chemical vapor deposition (MOCVD) are investigated using several electron-optical techniques. Combined high resolution transmission electron microscopy (HRTEM), electron energy loss spectrometry (EELS), and convergent beam electron diffraction (CBED) indicate a substantial influence of lattice strain on the structural and optical characteristics of BaTiO3 films. Spatially resolved EELS and CBED studies indicate that the substrate influence persists up to about 40 nm away from the interface. The changes in the dielectric function of the films, as inferred from spatially resolved EELS, appear to correlate well with internal lattice strain in the films as deduced from convergent beam electron diffraction (CBED).

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