Characterization of electron beam modified surface of Zircaloy-4

2006 ◽  
Vol 426 (1-2) ◽  
pp. 176-179 ◽  
Author(s):  
M. Ahmad ◽  
J.I. Akhter ◽  
G. Ali ◽  
M. Akhtar ◽  
M.A. Choudhry
Keyword(s):  
Electron Beam ◽  
Modified Surface

Erratum to “Characterization of electron beam modified surface of Zircaloy-4” [J. Alloys Compd. 426 (2006) 176–179]

2007 ◽  
Vol 428 (1-2) ◽  
pp. 362 ◽  
Author(s):  
M. Ahmad ◽  
J.I. Akhter ◽  
G. Ali ◽  
M. Akhtar ◽  
M.A. Choudhry
Keyword(s):  
Electron Beam ◽  
Modified Surface

Characterization of electron-beam-modified surface coated clay fillers and their influence on physical properties of rubbers

2002 ◽  
Vol 65 (6) ◽  
pp. 627-640 ◽  
Author(s):  
Sudip Ray ◽  
Anil K Bhowmick ◽  
K.S.S Sarma ◽  
A.B Majali ◽  
V.K Tikku
Keyword(s):  
Electron Beam ◽  
Physical Properties ◽  
Modified Surface

A very rapid in situ Kikuchi technique to determine relative crystal misorientation

1988 ◽  
Vol 46 ◽  
pp. 830-831
Author(s):  
J. I. Bennetch
Keyword(s):  
Electron Beam ◽  
Analytical Techniques ◽  
Superplastic Forming ◽  
The Other ◽  
Kikuchi Pattern ◽  
Kikuchi Line ◽  
Line Analysis

In a recent study of the superplastic forming (SPF) behavior of certain Al-Li-X alloys, the relative misorientation between adjacent (sub)grains proved to be an important parameter. It is well established that the most accurate way to determine misorientation across boundaries is by Kikuchi line analysis. However, the SPF study required the characterization of a large number of (sub)grains in each sample to be statistically meaningful, a very time-consuming task even for comparatively rapid Kikuchi analytical techniques.In order to circumvent this problem, an alternate, even more rapid in-situ Kikuchi technique was devised, eliminating the need for the developing of negatives and any subsequent measurements on photographic plates. All that is required is a double tilt low backlash goniometer capable of tilting ± 45° in one axis and ± 30° in the other axis. The procedure is as follows. While viewing the microscope screen, one merely tilts the specimen until a standard recognizable reference Kikuchi pattern is centered, making sure, at the same time, that the focused electron beam remains on the (sub)grain in question.

Characterization of AA7075/AA5356 gradient transition zone in an electron beam wire-feed additive manufactured sample

2021 ◽  
Vol 172 ◽  
pp. 110867
Author(s):  
V. Utyaganova ◽  
A. Filippov ◽  
S. Tarasov ◽  
N. Shamarin ◽  
D. Gurianov ◽  
...  
Keyword(s):  
Electron Beam ◽  
Transition Zone ◽  
Feed Additive ◽  
Wire Feed

scholarly journals Optical characterization of photosensitive AMTIR-1 chalcogenide thin layers deposited by electron beam deposition

2016 ◽  
Vol 442 ◽  
pp. 22-28 ◽  
Author(s):  
Alexandre Joërg ◽  
Fabien Lemarchand ◽  
Mengxue Zhang ◽  
Michel Lequime ◽  
Julien Lumeau
Keyword(s):  
Electron Beam ◽  
Optical Characterization ◽  
Thin Layers ◽  
Electron Beam Deposition ◽  
Beam Deposition

Electron-Beam-Induced Synthesis and Characterization of W18O49Nanowires

2008 ◽  
Vol 112 (15) ◽  
pp. 5856-5859 ◽  
Author(s):  
Guozhen Shen ◽  
Yoshio Bando ◽  
Dmitri Golberg ◽  
Chongwu Zhou
Keyword(s):  
Electron Beam ◽  
Synthesis And Characterization

scholarly journals Compton and Raman free electron laser stability properties for a cold electron beam propagating through a helical magnetic wiggler

1985 ◽  
Vol 33 (3) ◽  
pp. 387-423 ◽  
Author(s):  
John A. Davies ◽  
Ronald C. Davidson ◽  
George L. Johnston
Keyword(s):  
Magnetic Field ◽  
Electron Beam ◽  
Dispersion Relation ◽  
Free Electron ◽  
Free Electron Laser ◽  
Relativistic Electron Beam ◽  
Cold Electron ◽  
Wiggler Magnetic Field ◽  
Laser Stability

This paper gives an extensive characterization of the range of validity of the Compton and Raman approximations to the exact free electron laser dispersion relation for a cold, relativistic electron beam propagating through a constantamplitude helical wiggler magnetic field. The electron beam is treated as infinite in transverse extent. Specific properties of the exact and approximate dispersion relations are investigated analytically and numerically. In particular, a detailed numerical analysis is carried out to determine the range of validity of the Compton approximation.

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