Guest Editorial: Special section of the best papers from the 16th International Conference on Evaluation & Assessment in Software Engineering

Emilia Mendes; Marcela Genero

doi:10.1016/j.infsof.2013.07.006

Guest Editorial: Special section of the best papers from the 16th International Conference on Evaluation & Assessment in Software Engineering

Information and Software Technology ◽

10.1016/j.infsof.2013.07.006 ◽

2014 ◽

Vol 56 (1) ◽

pp. 39

Author(s):

Emilia Mendes ◽

Marcela Genero

Keyword(s):

Software Engineering ◽

Guest Editorial ◽

Special Section ◽

International Conference

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Guest Editorial: Special section on the selected papers from 14th International Conference on Evaluation and Assessment in Software Engineering (EASE 2010)

Information and Software Technology ◽

10.1016/j.infsof.2010.12.008 ◽

2011 ◽

Vol 53 (6) ◽

pp. 615

Author(s):

Mahmood Niazi ◽

Mark Turner

Keyword(s):

Software Engineering ◽

Guest Editorial ◽

Special Section ◽

International Conference ◽

Evaluation And Assessment

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Guest Editorial - Special Section on the International Conference on Frontiers of Characterization and Metrology for Nanoelectronics

IEEE Transactions on Semiconductor Manufacturing ◽

10.1109/tsm.2006.884597 ◽

2006 ◽

Vol 19 (4) ◽

pp. 370-371

Keyword(s):

Guest Editorial ◽

Special Section ◽

International Conference

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Guest Editorial for Special Section from Empirical Software Engineering & Measurement (ESEM) 2011

Information and Software Technology ◽

10.1016/j.infsof.2012.12.008 ◽

2013 ◽

Vol 55 (7) ◽

pp. 1277-1278

Author(s):

Martin Shepperd ◽

Forrest Shull

Keyword(s):

Software Engineering ◽

Guest Editorial ◽

Special Section ◽

Empirical Software Engineering ◽

Engineering Measurement

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Guest Editorial for the 8 th Symposium on Search Based Software Engineering Special Section

Information and Software Technology ◽

10.1016/j.infsof.2017.12.013 ◽

2018 ◽

Vol 95 ◽

pp. 265

Author(s):

Federica Sarro ◽

Kalyanmoy Deb ◽

Marouane Kessentini

Keyword(s):

Software Engineering ◽

Guest Editorial ◽

Special Section ◽

Search Based Software Engineering

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Guest Editorial for the Special Collection from the Third International Conference on Software Engineering.

IEEE Transactions on Software Engineering ◽

10.1109/tse.1978.231509 ◽

1978 ◽

Vol SE-4 (4) ◽

pp. 261-262

Keyword(s):

Software Engineering ◽

Guest Editorial ◽

International Conference ◽

The Third ◽

Special Collection

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Guest Editorial Special Section on the 2018 International Conference on Compound Semiconductor Manufacturing Technology (CS-MANTECH)

IEEE Transactions on Semiconductor Manufacturing ◽

10.1109/tsm.2018.2873469 ◽

2018 ◽

Vol 31 (4) ◽

pp. 411-412

Author(s):

Drew Hanser ◽

Patrick Fay

Keyword(s):

Semiconductor Manufacturing ◽

Guest Editorial ◽

Special Section ◽

Compound Semiconductor ◽

Manufacturing Technology ◽

International Conference

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Guest Editorial Special Section on the International Conference on Microelectronic Test Structures

IEEE Transactions on Semiconductor Manufacturing ◽

10.1109/tsm.2004.826931 ◽

2004 ◽

Vol 17 (2) ◽

pp. 77-78

Author(s):

B. Verzi ◽

A.J. Walton

Keyword(s):

Guest Editorial ◽

Special Section ◽

International Conference

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Editorial for the special section on Empirical Studies in Software Engineering Selected, and extended papers from the Eighteenth International Conference on Evaluation and Assessment in Software Engineering, May 13th–14th 2014, London, UK

Information and Software Technology ◽

10.1016/j.infsof.2015.02.015 ◽

2015 ◽

Vol 64 ◽

pp. 74-75

Author(s):

Tracy Hall ◽

Steve Counsell ◽

Ingunn Myrtveit

Keyword(s):

Software Engineering ◽

Special Section ◽

Empirical Studies ◽

International Conference ◽

Evaluation And Assessment

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Guest Editorial Special Section on the International Conference on Microelectronic Test Structures

IEEE Transactions on Semiconductor Manufacturing ◽

10.1109/tsm.2005.845013 ◽

2005 ◽

Vol 18 (2) ◽

pp. 237-237

Author(s):

N. Kasai

Keyword(s):

Guest Editorial ◽

Special Section ◽

International Conference

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Guest Editorial: Special Section on IEEE International Conference on Software Quality, Reliability, and Security (QRS) 2020

IEEE Transactions on Reliability ◽

10.1109/tr.2021.3083119 ◽

2021 ◽

Vol 70 (2) ◽

pp. 442-442

Author(s):

W. K. Chan ◽

Mei Nagappan ◽

Christof Budnik

Keyword(s):

Software Quality ◽

Guest Editorial ◽

Special Section ◽

International Conference ◽

Ieee International Conference

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