A risk-based approach for the design of rock slopes subject to multiple failure modes—illustrated by a case study in Hong Kong

2005 ◽  
Vol 42 (2) ◽  
pp. 261-275 ◽  
Author(s):  
R.J. Pine ◽  
W.J. Roberds
2014 ◽  
Vol 2014 ◽  
pp. 1-12 ◽  
Author(s):  
Shengjin Tang ◽  
Xiaosong Guo ◽  
Xiaoyan Sun ◽  
Haijian Xue ◽  
Zhaofa Zhou

Markov models are commonly used for unavailability analysis of redundant systems. However, due to the exploding states of Markov models for redundant systems, the states need to be merged to simplify the computation, which is called micro-Markov models. However, how to derive the failure rates and repair rates of the newly developed micro-Markov models has not been studied thoroughly. Therefore, this paper proposes detailed explanations and rules to derive the static unavailability by the micro-Markov models for thek-out-of-n:G systems with multiple failure modes. Firstly, two properties about applying the Markov models to the repairable system with independent multiple failure modes are presented. Based on these two properties, two rules are proposed for implementing the micro-Markov models. The micro-Markov models provide the exact same results for the repairablek-out-of-n:G system with multiple independent failure modes and repair mechanisms and approximate results for systems with multiple hybrid failure modes. A case study of safety integrity verification for safety instrumented systems is provided to illustrate the application of the proposed method. The conceptual comparison and numerical examples demonstrate the reasonability and usefulness of the proposed micro-Markov models.


2014 ◽  
Vol 72 (8) ◽  
pp. 2957-2969 ◽  
Author(s):  
Changjie Xu ◽  
Lei Wang ◽  
Yong Ming Tien ◽  
Jian-Min Chen ◽  
C. Hsein Juang

2001 ◽  
Vol 6 (1) ◽  
pp. 15-31 ◽  
Author(s):  
Charlie Q L Xue ◽  
Kevin K Manuel ◽  
Rex H Y Chung
Keyword(s):  

Author(s):  
Erick Kim ◽  
Kamjou Mansour ◽  
Gil Garteiz ◽  
Javeck Verdugo ◽  
Ryan Ross ◽  
...  

Abstract This paper presents the failure analysis on a 1.5m flex harness for a space flight instrument that exhibited two failure modes: global isolation resistances between all adjacent traces measured tens of milliohm and lower resistance on the order of 1 kiloohm was observed on several pins. It shows a novel method using a temperature controlled air stream while monitoring isolation resistance to identify a general area of interest of a low isolation resistance failure. The paper explains how isolation resistance measurements were taken and details the steps taken in both destructive and non-destructive analyses. In theory, infrared hotspot could have been completed along the length of the flex harness to locate the failure site. However, with a field of view of approximately 5 x 5 cm, this technique would have been time prohibitive.


Author(s):  
Martin Versen ◽  
Dorina Diaconescu ◽  
Jerome Touzel

Abstract The characterization of failure modes of DRAM is often straight forward if array related hard failures with specific addresses for localization are concerned. The paper presents a case study of a bitline oriented failure mode connected to a redundancy evaluation in the DRAM periphery. The failure mode analysis and fault modeling focus both on the root-cause and on the test aspects of the problem.


Author(s):  
Bhanu P. Sood ◽  
Michael Pecht ◽  
John Miker ◽  
Tom Wanek

Abstract Schottky diodes are semiconductor switching devices with low forward voltage drops and very fast switching speeds. This paper provides an overview of the common failure modes in Schottky diodes and corresponding failure mechanisms associated with each failure mode. Results of material level evaluation on diodes and packages as well as manufacturing and assembly processes are analyzed to identify a set of possible failure sites with associated failure modes, mechanisms, and causes. A case study is then presented to illustrate the application of a systematic FMMEA methodology to the analysis of a specific failure in a Schottky diode package.


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