Anatomical differences in lower third molars visualized by 2D and 3D X-ray imaging: clinical outcomes after extraction

2013 ◽  
Vol 42 (4) ◽  
pp. 489-496 ◽  
Author(s):  
S.H. Jun ◽  
C.H. Kim ◽  
J.S. Ahn ◽  
B.L. Padwa ◽  
J.J. Kwon
2018 ◽  
Vol 28 (4) ◽  
pp. 1-9
Author(s):  
Ali Aldhebaib ◽  
Oinam Gokulchandra Singh ◽  
Zyad Almutlaq ◽  
Fayazul Haq ◽  
Adel Ali Alharbi ◽  
...  

2017 ◽  
Vol 44 (2) ◽  
pp. 407-416 ◽  
Author(s):  
Lynda C. Ikejimba ◽  
Christian G. Graff ◽  
Shani Rosenthal ◽  
Andreu Badal ◽  
Bahaa Ghammraoui ◽  
...  
Keyword(s):  
X Ray ◽  

Plant Methods ◽  
2018 ◽  
Vol 14 (1) ◽  
Author(s):  
Julio V. Schneider ◽  
Renate Rabenstein ◽  
Jens Wesenberg ◽  
Karsten Wesche ◽  
Georg Zizka ◽  
...  

2017 ◽  
Author(s):  
Lynda C. Ikejimba ◽  
Christian G. Graff ◽  
Shani Rosenthal ◽  
Andreu Badal ◽  
Bahaa Ghammraoui ◽  
...  

Author(s):  
James G. Mainprize ◽  
Gordon E. Mawdsley ◽  
Ann-Katherine Carton ◽  
Zhijin Li ◽  
Remy Klausz ◽  
...  

2022 ◽  
Vol 29 (1) ◽  
Author(s):  
Sebastian Kalbfleisch ◽  
Yuhe Zhang ◽  
Maik Kahnt ◽  
Khachiwan Buakor ◽  
Max Langer ◽  
...  

Coherent X-ray imaging techniques, such as in-line holography, exploit the high brilliance provided by diffraction-limited storage rings to perform imaging sensitive to the electron density through contrast due to the phase shift, rather than conventional attenuation contrast. Thus, coherent X-ray imaging techniques enable high-sensitivity and low-dose imaging, especially for low-atomic-number (Z) chemical elements and materials with similar attenuation contrast. Here, the first implementation of in-line holography at the NanoMAX beamline is presented, which benefits from the exceptional focusing capabilities and the high brilliance provided by MAX IV, the first operational diffraction-limited storage ring up to approximately 300 eV. It is demonstrated that in-line holography at NanoMAX can provide 2D diffraction-limited images, where the achievable resolution is only limited by the 70 nm focal spot at 13 keV X-ray energy. Also, the 3D capabilities of this instrument are demonstrated by performing holotomography on a chalk sample at a mesoscale resolution of around 155 nm. It is foreseen that in-line holography will broaden the spectra of capabilities of MAX IV by providing fast 2D and 3D electron density images from mesoscale down to nanoscale resolution.


Author(s):  
Nikolay Dukov ◽  
Kristina Bliznakova ◽  
Tsvetelina Teneva ◽  
Stoyko Marinov ◽  
Predrag Bakic ◽  
...  

2007 ◽  
Vol 34 (9) ◽  
pp. 3649-3664 ◽  
Author(s):  
C. Schmidgunst ◽  
D. Ritter ◽  
E. Lang

Author(s):  
S.H. Lau ◽  
Sheraz Gul ◽  
Guibin Zan ◽  
David Vine ◽  
Sylvia Lewis ◽  
...  

Abstract Currently gaps in non-destructive 2D and 3D imaging in PFA for advanced packages and MEMS exist due to lack of resolution to resolve sub-micron defects and the lack of contrast to image defects within the low Z materials. These low Z defects in advanced packages include sidewall delamination between Si die and underfill, bulk cracks in the underfill, in organic substrates, Redistribution Layer, RDL; Si die cracks; voids within the underfill and in the epoxy. Similarly, failure modes in MEMS are often within low Z materials, such as Si and polymers. Many of these are a result of mechanical shock resulting in cracks in structures, packaging fractures, die adhesion issues or particles movements into critical locations. Most of these categories of defects cannot be detected non-destructively by existing techniques such as C-SAM or microCT (micro x-ray computed tomography) and XRM (X-ray microscope). We describe a novel lab-based X-ray Phase contrast and Dark-field/Scattering Contrast system with the potential to resolve these types of defects. This novel X-ray microscopy has spatial resolution of 0.5 um in absorption contrast and with the added capability of Talbot interferometry to resolve failure issues which are related to defects within organic and low Z components.


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