A robust and rotationally invariant local surface descriptor with applications to non-local mesh processing

2011 ◽  
Vol 73 (5) ◽  
pp. 231-242 ◽  
Author(s):  
A. Maximo ◽  
R. Patro ◽  
A. Varshney ◽  
R. Farias
Keyword(s):  
Local Surface ◽  
Mesh Processing ◽  
Non Local ◽  
Rotationally Invariant

Rotationally-invariant non-local means for image denoising and tomography

2015 ◽  
Author(s):  
Suhas Sreehari ◽  
S. V. Venkatakrishnan ◽  
Lawrence Drummy ◽  
Jeff Simmons ◽  
Charles A. Bouman
Keyword(s):  
Image Denoising ◽  
Local Means ◽  
Non Local ◽  
Rotationally Invariant

scholarly journals On the Non-Local Surface Plasmons’ Contribution to the Casimir Force between Graphene Sheets

Physics ◽  
2020 ◽  
Vol 2 (1) ◽  
pp. 22-31
Author(s):  
Yan Francescato ◽  
Simon R. Pocock ◽  
Vincenzo Giannini
Keyword(s):  
Casimir Force ◽  
State Of The Art ◽  
Casimir Forces ◽  
Dirac Cone ◽  
Local Surface ◽  
Dramatic Effect ◽  
Non Local ◽  
Cone Approximation ◽  
Non Locality

Herein we demonstrate the dramatic effect of non-locality on the plasmons which contribute to the Casimir forces, with a graphene sandwich as a case study. The simplicity of this system allowed us to trace each contribution independently, as we observed that interband processes, although dominating the forces at short separations, are poorly accounted for in the framework of the Dirac cone approximation alone, and should be supplemented with other descriptions for energies higher than 2.5 eV. Finally, we proved that distances smaller than 200 nm, despite being extremely relevant to state-of-the-art measurements and nanotechnology applications, are inaccessible with closed-form response function calculations at present.

Generalized non-local surface susceptibility model and Fresnel coefficients for the characterization of periodic metafilms with bianisotropic scatterers

2015 ◽  
Vol 281 ◽  
pp. 251-268 ◽  
Author(s):  
Alexandros I. Dimitriadis ◽  
Nikolaos V. Kantartzis ◽  
Theodoros D. Tsiboukis ◽  
Christian Hafner
Keyword(s):  
Local Surface ◽  
Susceptibility Model ◽  
Non Local ◽  
Fresnel Coefficients

Toward High-Resolution Low-Voltage SEM

1988 ◽  
Vol 46 ◽  
pp. 218-219
Author(s):  
Zhifeng Shao
Keyword(s):  
Low Voltage ◽  
Spherical Aberration ◽  
Chromatic Aberration ◽  
Limiting Factor ◽  
Operating Voltage ◽  
Probe Radius ◽  
Non Local ◽  
Electron Microscopes ◽  
Image Position ◽  
Scanning Electron Microscopes

Recently, low voltage (≤5kV) scanning electron microscopes have become popular because of their unprecedented advantages, such as minimized charging effects and smaller specimen damage, etc. Perhaps the most important advantage of LVSEM is that they may be able to provide ultrahigh resolution since the interaction volume decreases when electron energy is reduced. It is obvious that no matter how low the operating voltage is, the resolution is always poorer than the probe radius. To achieve 10Å resolution at 5kV (including non-local effects), we would require a probe radius of 5∽6 Å. At low voltages, we can no longer ignore the effects of chromatic aberration because of the increased ratio δV/V. The 3rd order spherical aberration is another major limiting factor. The optimized aperture should be calculated as

Chromatic aberration and low-voltage SEM

1987 ◽  
Vol 45 ◽  
pp. 546-547
Author(s):  
Zhifeng Shao ◽  
A.V. Crewe
Keyword(s):  
Electron Energy ◽  
Low Voltage ◽  
Spherical Aberration ◽  
Chromatic Aberration ◽  
Primary Electron ◽  
Probe Size ◽  
Non Local ◽  
Optical Treatment ◽  
Electron Microscopes ◽  
Scanning Electron Microscopes

For scanning electron microscopes, it is plausible that by lowering the primary electron energy, one can decrease the volume of interaction and improve resolution. As shown by Crewe /1/, at V0 =5kV a 10Å resolution (including non-local effects) is possible. To achieve this, we would need a probe size about 5Å. However, at low voltages, the chromatic aberration becomes the major concern even for field emission sources. In this case, δV/V = 0.1 V/5kV = 2x10-5. As a rough estimate, it has been shown that /2/ the chromatic aberration δC should be less than ⅓ of δ0 the probe size determined by diffraction and spherical aberration in order to neglect its effect. But this did not take into account the distribution of electron energy. We will show that by using a wave optical treatment, the tolerance on the chromatic aberration is much larger than we expected.

Pictorial Reliefs as Organized Local Surface Shapes

2013 ◽  
Author(s):  
Johan Wagemans ◽  
Andrea Van Doorn ◽  
Jan Koenderink
Keyword(s):  
Local Surface
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