A high frequency model for predicting the behavior of lithium-ion batteries connected to fast switching power electronics

2018 ◽  
Vol 18 ◽  
pp. 40-49 ◽  
Author(s):  
Pablo Korth Pereira Ferraz ◽  
Robert Schmidt ◽  
Delf Kober ◽  
Julia Kowal
2001 ◽  
Vol 16 (2) ◽  
pp. 157-166 ◽  
Author(s):  
S. Siami ◽  
C. Joubert ◽  
C. Glaize

2019 ◽  
Vol 11 (21) ◽  
pp. 6050 ◽  
Author(s):  
Pablo Korth Pereira Ferraz ◽  
Julia Kowal

Modern battery energy systems are key enablers of the conversion of our energy and mobility sector towards renewability. Most of the time, their batteries are connected to power electronics that induce high frequency current ripple on the batteries that could lead to reinforced battery ageing. This study investigates the influence of high frequency current ripple on the ageing of commercially available, cylindrical 18,650 lithium-ion batteries in comparison to identical batteries that are aged with a conventional battery test system. The respective ageing tests that have been carried out to obtain numerous parameters such as the capacity loss, the gradient of voltage curves and impedance spectra are explained and evaluated to pinpoint how current ripple possibly affects battery ageing. Finally, the results suggest that there is little to no further influence of current ripple that is severe enough to stand out against ageing effects due to the underlying accelerated cyclic ageing.


Energies ◽  
2021 ◽  
Vol 14 (10) ◽  
pp. 2835
Author(s):  
Ivana Kovacevic-Badstuebner ◽  
Daniele Romano ◽  
Giulio Antonini ◽  
Jonas Ekman ◽  
Ulrike Grossner

Broadband electromagnetic (EM) modeling increases in importance for virtual prototyping of advanced power electronics systems (PES), enabling a more accurate prediction of fast switching converter operation and its impact on energy conversion efficiency and EM interference. With the aim to predict and reduce an adverse impact of parasitics on the dynamic performance of fast switching power semiconductor devices, the circuit-oriented EM modeling based on the extraction of equivalent lumped R-L-C-G circuits is frequently selected over the Finite Element Method (FEM)-based EM modeling, mainly due to its lower computational complexity. With requirements for more accurate virtual prototyping of fast-switching PES, the modeling accuracy of the equivalent-RLCG-circuit-based EM modeling has to be re-evaluated. In the literature, the equivalent-RLCG-circuit-based EM techniques are frequently misinterpreted as the quasi-static (QS) 3-D Partial Element Equivalent Circuit (PEEC) method, and the observed inaccuracies of modeling HF effects are attributed to the QS field assumption. This paper presents a comprehensive analysis on the differences between the QS 3-D PEEC-based and the equivalent-RLCG-circuit-based EM modeling for simulating the dynamics of fast switching power devices. Using two modeling examples of fast switching power MOSFETs, a 3-D PEEC solver developed in-house and the well-known equivalent-RLCG-circuit-based EM modeling tool, ANSYS Q3D, are compared to the full-wave 3-D FEM-based EM tool, ANSYS HFSS. It is shown that the QS 3-D PEEC method can model the fast switching transients more accurately than Q3D. Accordingly, the accuracy of equivalent-RLCG-circuit-based modeling approaches in the HF range is rather related to the approximations made on modeling electric-field induced effects than to the QS field assumption.


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