Generalized method for identifying yield-line patterns in T-stubs using discontinuity layout optimization
Keyword(s):
Keyword(s):
1999 ◽
Vol 21
(6)
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pp. 488-496
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1999 ◽
Vol 70
(3)
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pp. 257-271
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2020 ◽
Vol 166
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pp. 105932
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