Microscopic work function anisotropy and surface chemistry of 316L stainless steel using photoelectron emission microscopy

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/j.elspec.2014.05.015 ◽

2014 ◽

Vol 195 ◽

pp. 117-124 ◽

Cited By ~ 6

Author(s):

N. Barrett ◽

O. Renault ◽

H. Lemaître ◽

P. Bonnaillie ◽

F. Barcelo ◽

...

Keyword(s):

Stainless Steel ◽

Surface Chemistry ◽

Work Function ◽

316L Stainless Steel ◽

Photoelectron Emission ◽

Emission Microscopy ◽

Photoelectron Emission Microscopy

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Surface chemistry along a single silicon nanowire: Quantitative x-ray photoelectron emission microscopy (XPEEM) of the metal catalyst diffusion

EMC 2008 14th European Microscopy Congress 1–5 September 2008, Aachen, Germany ◽

10.1007/978-3-540-85226-1_76 ◽

2008 ◽

pp. 151-152

Author(s):

O. Renault ◽

A. Bailly ◽

P. Gentile ◽

N. Pauc ◽

T. Baron ◽

...

Keyword(s):

Surface Chemistry ◽

Silicon Nanowire ◽

Metal Catalyst ◽

Photoelectron Emission ◽

X Ray ◽

Emission Microscopy ◽

Photoelectron Emission Microscopy

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Lateral variation of the native passive film on super duplex stainless steel resolved by synchrotron hard X-ray photoelectron emission microscopy

Corrosion Science ◽

10.1016/j.corsci.2020.108841 ◽

2020 ◽

Vol 174 ◽

pp. 108841 ◽

Cited By ~ 2

Author(s):

M. Långberg ◽

F. Zhang ◽

E. Grånäs ◽

C. Örnek ◽

J. Cheng ◽

...

Keyword(s):

Stainless Steel ◽

Duplex Stainless Steel ◽

Passive Film ◽

Super Duplex Stainless Steel ◽

Lateral Variation ◽

Photoelectron Emission ◽

X Ray ◽

Emission Microscopy ◽

Photoelectron Emission Microscopy

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Work Function Measurement of Silicon Germanium Heterostructures Combining Kelvin Force Microscopy and X-ray Photoelectron Emission Microscopy

The Journal of Physical Chemistry C ◽

10.1021/acs.jpcc.5b09278 ◽

2015 ◽

Vol 119 (47) ◽

pp. 26776-26782 ◽

Cited By ~ 8

Author(s):

Sylvain Pouch ◽

Michele Amato ◽

Matteo Bertocchi ◽

Stefano Ossicini ◽

Nicolas Chevalier ◽

...

Keyword(s):

Work Function ◽

Silicon Germanium ◽

Photoelectron Emission ◽

Function Measurement ◽

X Ray ◽

Force Microscopy ◽

Emission Microscopy ◽

Photoelectron Emission Microscopy

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Laboratory-based real and reciprocal space imaging of the electronic structure of few layer graphene on SiC(0001¯) using photoelectron emission microscopy

Ultramicroscopy ◽

10.1016/j.ultramic.2013.02.010 ◽

2013 ◽

Vol 130 ◽

pp. 94-100 ◽

Cited By ~ 3

Author(s):

N. Barrett ◽

K. Winkler ◽

B. Krömker ◽

E.H. Conrad

Keyword(s):

Electronic Structure ◽

Reciprocal Space ◽

Photoelectron Emission ◽

Layer Graphene ◽

Emission Microscopy ◽

Few Layer Graphene ◽

Photoelectron Emission Microscopy

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Beam-induced effects in soft X-ray photoelectron emission microscopy experiments

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/j.elspec.2008.09.003 ◽

2009 ◽

Vol 170 (1-3) ◽

pp. 13-18 ◽

Cited By ~ 21

Author(s):

L. Gregoratti ◽

T.O. Mentes ◽

A. Locatelli ◽

M. Kiskinova

Keyword(s):

Photoelectron Emission ◽

X Ray ◽

Emission Microscopy ◽

Photoelectron Emission Microscopy

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The Surface Oxidation Potential of Melanosomes Measured by Free Electron Laser-Photoelectron Emission Microscopy

Photochemistry and Photobiology ◽

10.1562/2006-09-11-ra-1037 ◽

2007 ◽

Vol 83 (3) ◽

pp. 692-697 ◽

Cited By ~ 5

Author(s):

Jacob Garguilo ◽

Lian Hong ◽

Glenn S. Edwards ◽

Robert J. Nemanich ◽

John D. Simon

Keyword(s):

Free Electron ◽

Free Electron Laser ◽

Surface Oxidation ◽

Oxidation Potential ◽

Photoelectron Emission ◽

Emission Microscopy ◽

Photoelectron Emission Microscopy

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Electrical and physical topography in energy-filtered photoelectron emission microscopy of two-dimensional silicon pn junctions

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/j.elspec.2013.01.014 ◽

2013 ◽

Vol 186 ◽

pp. 30-38 ◽

Cited By ~ 10

Author(s):

Maylis Lavayssière ◽

Matthias Escher ◽

Olivier Renault ◽

Denis Mariolle ◽

Nicholas Barrett

Keyword(s):

Two Dimensional ◽

Photoelectron Emission ◽

Emission Microscopy ◽

Pn Junctions ◽

Photoelectron Emission Microscopy

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Photoelectron emission microscopy

Synchrotron Radiation News ◽

10.1080/08940889108602626 ◽

1991 ◽

Vol 4 (4) ◽

pp. 29-34 ◽

Cited By ~ 7

Author(s):

M. Mundschau

Keyword(s):

Photoelectron Emission ◽

Emission Microscopy ◽

Photoelectron Emission Microscopy

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Measurement of local magnetic fields in photoelectron emission microscopy by restriction of the electron beams

Review of Scientific Instruments ◽

10.1063/1.1449462 ◽

2002 ◽

Vol 73 (3) ◽

pp. 1224-1228 ◽

Cited By ~ 2

Author(s):

S. A. Nepijko ◽

N. N. Sedov ◽

H. Ohldag ◽

E. Kisker

Keyword(s):

Magnetic Fields ◽

Electron Beams ◽

Photoelectron Emission ◽

Local Magnetic Fields ◽

Emission Microscopy ◽

Photoelectron Emission Microscopy

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Energy-filtered Photoelectron Emission Microscopy (EF-PEEM) for imaging nanoelectronic materials

10.1063/1.2799425 ◽

2007 ◽

Cited By ~ 1

Author(s):

Olivier Renault ◽

Amal Chabli ◽

David G. Seiler ◽

Alain C. Diebold ◽

Robert McDonald ◽

...

Keyword(s):

Photoelectron Emission ◽

Emission Microscopy ◽

Photoelectron Emission Microscopy

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