High acceptance high resolution soft X-ray grating spectrometer: Choice of optical design

2013 ◽  
Vol 188 ◽  
pp. 121-126 ◽  
Author(s):  
S.G. Chiuzbaian ◽  
C.F. Hague
Keyword(s):  
High Resolution ◽  
Optical Design ◽  
X Ray ◽  
Grating Spectrometer

Arcus: an ISS-attached high-resolution x-ray grating spectrometer

2014 ◽  
Author(s):  
R. K. Smith ◽  
M. Ackermann ◽  
R. Allured ◽  
M. W. Bautz ◽  
J. Bregman ◽  
...  
Keyword(s):  
High Resolution ◽  
X Ray ◽  
Grating Spectrometer

scholarly journals High resolution X-ray spectroscopy ofζPuppis with the XMM-Newton reflection grating spectrometer

2001 ◽  
Vol 365 (1) ◽  
pp. L312-L317 ◽  
Author(s):  
S. M. Kahn ◽  
M. A. Leutenegger ◽  
J. Cottam ◽  
G. Rauw ◽  
J.-M. Vreux ◽  
...  
Keyword(s):  
High Resolution ◽  
X Ray ◽  
Grating Spectrometer ◽  
Reflection Grating

Flat-field grating spectrometer for high-resolution soft x-ray and extreme ultraviolet measurements on an electron beam ion trap

2004 ◽  
Vol 75 (10) ◽  
pp. 3723-3726 ◽  
Author(s):  
P. Beiersdorfer ◽  
E. W. Magee ◽  
E. Träbert ◽  
H. Chen ◽  
J. K. Lepson ◽  
...  
Keyword(s):  
Electron Beam ◽  
High Resolution ◽  
Ion Trap ◽  
Extreme Ultraviolet ◽  
X Ray ◽  
Grating Spectrometer ◽  
Electron Beam Ion Trap ◽  
Flat Field

scholarly journals The μmRIXS spectrometer at BESSY II

2016 ◽  
Vol 2 ◽  
Author(s):  
Annette Pietzsch
Keyword(s):  
High Resolution ◽  
Spatial Resolution ◽  
X Ray ◽  
Grating Spectrometer ◽  
X Ray Scattering ◽  
Small Focus ◽  
Ray Scattering

The μmRIXS confocal plane grating spectrometer offers high resolution resonant inelastic x-ray scattering (RIXS) spectroscopy in the soft x-ray range between 50 eV and 1000 eV. The small focus of its dedicated beamline allows for spectroscopical imaging at selected sample sites with a spatial resolution of 1 micrometer.

High-Resolution X-Ray Spectra of Capella: Initial Results from the [ITAL]Chandra[/ITAL] High-Energy Transmission Grating Spectrometer

2000 ◽  
Vol 539 (1) ◽  
pp. L41-L44 ◽  
Author(s):  
C. R. Canizares ◽  
D. P. Huenemoerder ◽  
D. S. Davis ◽  
D. Dewey ◽  
K. A. Flanagan ◽  
...  
Keyword(s):  
High Resolution ◽  
High Energy ◽  
Energy Transmission ◽  
X Ray ◽  
Transmission Grating ◽  
Grating Spectrometer ◽  
Initial Results

scholarly journals Development of the Soft X-ray AGM–AGS RIXS beamline at the Taiwan Photon Source

2021 ◽  
Vol 28 (3) ◽  
Author(s):  
A. Singh ◽  
H. Y. Huang ◽  
Y. Y. Chu ◽  
C. Y. Hua ◽  
S. W. Lin ◽  
...  
Keyword(s):  
High Resolution ◽  
Optical Design ◽  
Charge Density Waves ◽  
Resolving Power ◽  
X Rays ◽  
X Ray ◽  
Compensation Principle ◽  
Wide Range ◽  
Energy Compensation ◽  
Photon Source

We report on the development of a high-resolution and highly efficient beamline for soft X-ray resonant inelastic X-ray scattering (RIXS) located at the Taiwan Photon Source. This beamline adopts an optical design that uses an active grating monochromator (AGM) and an active grating spectrometer (AGS) to implement the energy compensation principle of grating dispersion. Active gratings are utilized to diminish defocus, coma and higher-order aberrations, as well as to decrease the slope errors caused by thermal deformation and optical polishing. The AGS is mounted on a rotatable granite platform to enable momentum-resolved RIXS measurements with scattering angles over a wide range. Several high-precision instruments developed in-house for this beamline are described briefly. The best energy resolution obtained from this AGM–AGS beamline was 12.4 meV at 530 eV, achieving a resolving power of 4.2 × 104, while the bandwidth of the incident soft X-rays was kept at 0.5 eV. To demonstrate the scientific impact of high-resolution RIXS, we present an example of momentum-resolved RIXS measurements on a high-temperature superconducting cuprate, i.e. La2–x Sr x CuO4. The measurements reveal the A1g buckling phonons in superconducting cuprates, opening a new opportunity to investigate the coupling between these phonons and charge-density waves.

scholarly journals High Resolution EUV & Soft X-Ray Spectrometers Using Variable Groove Spacings

1984 ◽  
Vol 86 ◽  
pp. 84-87
Author(s):  
M. Lampton ◽  
M.C Hettrick ◽  
S. Bowyer
Keyword(s):  
High Resolution ◽  
Optical System ◽  
Spectroscopic Analysis ◽  
Grazing Incidence ◽  
Focus Beam ◽  
Astrophysical Plasmas ◽  
X Ray ◽  
Stellar Spectroscopy ◽  
Grating Spectrometer ◽  
Reflection Grating

Spectroscopic analysis is a powerful technique for the diagnosis of temperatures and compositions of astrophysical plasmas. The EUV (100–1000Å) and soft x-ray (10–100Å) bands contain hundreds of potentially useful diagnostic lines. Unfortunately, traditional types of grating spectrometer become inefficient or unwieldy when adapted to stellar spectroscopy onboard a spacecraft. At grazing incidence, the required length of a high-resolution plane-grating spectrometer can easily exceed the length of the telescope feeding it. For these reasons, we have systematically explored ways to introduce a reflection grating into the converging beam formed by a given objective optical system ahead of its first focus. A spectrometer of this type results in an optical train no longer than the telescope’s existing prime-focus beam.

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