Effects of epitaxial films of nanometric thickness on the X-ray photoelectron diffraction intensities from substrates

2012 ◽  
Vol 185 (11) ◽  
pp. 470-474 ◽  
Author(s):  
A. Atrei
Keyword(s):  
Epitaxial Films ◽  
X Ray ◽  
Photoelectron Diffraction

Surfactant-Mediated Growth of Epitaxial Films on Quasiperiodic Surfaces

2000 ◽  
Vol 643 ◽  
Author(s):  
Masahiko Shimoda ◽  
Junqing Guo ◽  
Taku J. Sato ◽  
An Pang Tsai
Keyword(s):  
Epitaxial Film ◽  
Metal Films ◽  
Epitaxial Films ◽  
Single Element ◽  
Al Alloy ◽  
Icosahedral Structure ◽  
Crystalline Layer ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
First Time

AbstractWe have succeeded for the first time in inducing epitaxial growth of metal films on quasiperiodic surfaces. Depositions of Au onto the tenfold surface of a decagonal Al-Ni-Co quasicrystal were originally attempted to create a quasicrystal of a single element as an epitaxial film. Although the desired film was not obtained on the clean surface, a multiply twinned AuAl2 crystalline layer with a (110)-oriented surface was formed with the aid of an In pre-deposition layer. The presence of pre-deposited In also worked as a surfactant for the case of Au-deposition onto the fivefold surface of an icosahedral Al-Pd-Mn quasicrystal and promoted the formation of an ordered film of Au-Al alloy. X-ray photoelectron diffraction images from this ordered film show that the alloy has an icosahedral structure as a long-range order, suggesting the formation of a quasicrystalline film.

Substitution sites of Pb and Y in Bi2Sr2Ca1Cu2O8+δ: X-ray photoelectron diffraction as fingerprinting tool

1999 ◽  
Vol 75 (11) ◽  
pp. 1550-1552 ◽  
Author(s):  
Th. Pillo ◽  
J. Hayoz ◽  
P. Schwaller ◽  
H. Berger ◽  
P. Aebi ◽  
...  
Keyword(s):  
X Ray ◽  
Photoelectron Diffraction

Structure of the ZnO(0001) surface studied by X-ray photoelectron diffraction

1994 ◽  
Vol 222 (4) ◽  
pp. 349-352 ◽  
Author(s):  
M. Galeotti ◽  
A. Atrei ◽  
U. Bardi ◽  
G. Rovida ◽  
M. Torrini ◽  
...  
Keyword(s):  
X Ray ◽  
Photoelectron Diffraction

Hard-X-ray Photoelectron Diffraction from Si(001) Covered by a 0–7-nm-Thick SiO2Layer

2010 ◽  
Vol 3 (5) ◽  
pp. 056701 ◽  
Author(s):  
Igor Píš ◽  
Masaaki Kobata ◽  
Tomohiro Matsushita ◽  
Hiroshi Nohira ◽  
Keisuke Kobayashi
Keyword(s):  
X Ray ◽  
Photoelectron Diffraction

The Rh oxide ultrathin film on Rh(100): An x-ray photoelectron diffraction study

2010 ◽  
Vol 133 (21) ◽  
pp. 214701 ◽  
Author(s):  
Rong Rong Zhan ◽  
Erik Vesselli ◽  
Alessandro Baraldi ◽  
Silvano Lizzit ◽  
Giovanni Comelli
Keyword(s):  
Diffraction Study ◽  
Ultrathin Film ◽  
X Ray ◽  
Photoelectron Diffraction ◽  
Rh Oxide

Influence of LaNiO3 as an Electrode on the Properties of Ferroelectric Oxides

2000 ◽  
Vol 623 ◽  
Author(s):  
R. Kalare ◽  
M. Vedawyas ◽  
A. Kumar
Keyword(s):  
Ferroelectric Properties ◽  
Ferroelectric Thin Film ◽  
Memory Device ◽  
Epitaxial Films ◽  
Laser Deposition ◽  
Oxide Materials ◽  
X Ray Diffraction ◽  
X Ray ◽  
Potential Electrode ◽  
Ferroelectric Oxides

AbstractAn electrode plays an important role in realising a ferroelectric thin film as a potential memory device. We have investigated LaNiO3 (LNO) as a potential electrode material and evaluated the ferroelectric properties of oxide materials like strontium bismuth tantalate (SBT) and barium titanate(BT). We have successfully deposited epitaxial films of LNO on Pt coated Si(100) and LaAlO3 (LAO) substrates using the pulsed excimer laser deposition technique. We are able to grow high quality SBT and BT films on top of this LNO layer. The X-ray diffraction revealed the epitaxy of the LNO, SBT and BT films. The ferroelectric properties of SBTand BT were investigated using the RT66A ferroelectric tester.

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