Negative ion formation from photoexcited carbon tetrachloride and silicon tetrachloride studied by negative-ion mass spectrometry in the range of 12.4–31.0eV

2008 ◽  
Vol 163 (1-3) ◽  
pp. 40-44 ◽  
Author(s):  
Bong Hyun Boo ◽  
Inosuke Koyano
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