Variation of electronic structures of CeAl2 thin films with thickness studied by X-ray absorption near-edge structure spectroscopy

2006 ◽  
Vol 152 (1-2) ◽  
pp. 1-5 ◽  
Author(s):  
C.L. Dong ◽  
K. Asokan ◽  
C.L. Chang ◽  
C.L. Chen ◽  
P.C. Lee ◽  
...  
Keyword(s):  
Thin Films ◽  
Electronic Structures ◽  
Edge Structure ◽  
X Ray ◽  
X Ray Absorption

scholarly journals Effect of thickness and Si substrate morphology in La0.7Sr0.3MnO3/Si thin films

2014 ◽  
Vol 70 (a1) ◽  
pp. C1532-C1532
Author(s):  
Hsiao-Tsu Wang ◽  
Mau- Kuen Wu ◽  
Yu-Cheng Shao ◽  
Yu-Fu Wang ◽  
Shang-Hsien Hsieh ◽  
...  
Keyword(s):  
Thin Films ◽  
Magnetic Properties ◽  
Electronic Structures ◽  
Magnetic Circular Dichroism ◽  
Magnetic Behavior ◽  
Si Substrate ◽  
Edge Structure ◽  
X Ray ◽  
X Ray Absorption ◽  
Different Thickness

Investigation has been made on atomic, electronic structures and magnetic properties of La0.7Sr0.3MnO3 (LSMO) on Si substrate. The effect of different thickness of LSMO and different morphological [flat and nano-pyramid (NP)] of Si substrate are studied in present work. The result of Mn K-edge extended x-ray absorption fine structure indicates the more disorder of local atomic structure of first shell (Mn-O bound) in the thinner LSMO/Si film. The Mn L3,2-edge x-ray absorption near-edge structure shows the presence of Mn2+ ion on the sample. Furthermore, the Mn L3,2-edge x-ray magnetic circular dichroism reveals that the thinner film (LSMO/Si) has highest magnetic moment, in comparison to that of thick LSMO/Si and LSMO/Si-NP samples. This finding suggests that the appearance Mn2+ may play an important role in magnetic behavior of hetero-junction LSMnO/Si and Si-NP.

The Control of Electronic States Spreading Outside the Conjugated Polymer Surface

2006 ◽  
Vol 965 ◽  
Author(s):  
Xiao Tao Hao ◽  
Takuya Hosokai ◽  
Noritaka Mitsuo ◽  
Satoshi Kera ◽  
Kazuyuki Sakamoto ◽  
...  
Keyword(s):  
Thin Films ◽  
Photoelectron Spectroscopy ◽  
Electronic Structures ◽  
Conjugated Polymer ◽  
Polymer Surface ◽  
Electronic States ◽  
Penning Ionization ◽  
X Ray ◽  
Molecular Ordering ◽  
X Ray Absorption

ABSTRACTThe surface electronic structures of conjugated regio regular and regio random poly (3- hexylthiophene) (rr-P3HT and rra-P3HT) thin films were studied by near edge X-ray absorption fine structure spectroscopy, ultraviolet photoelectron spectroscopy and Penning ionization electron spectroscopy (PIES). The distribution of the surface electronic states was controlled on rr-P3HT and rra-P3HT thin films with different molecular ordering by varying the coating process and PIES was adopted to observe the electronic states existing outside the surface.

Electronic structures of CdSe nanocrystals — An X-ray absorption near-edge structure (XANES) investigation

2007 ◽  
Vol 85 (10) ◽  
pp. 756-760 ◽  
Author(s):  
Jigang Zhou ◽  
Xingtai Zhou ◽  
Xuhui Sun ◽  
Michael Murphy ◽  
Franziskus Heigl ◽  
...  
Keyword(s):  
Electronic Structures ◽  
Quantum Confinement Effect ◽  
Chemical Properties ◽  
Trioctylphosphine Oxide ◽  
Cdse Nanocrystals ◽  
Edge Structure ◽  
X Ray ◽  
Vis Spectroscopy ◽  
Capping Ligands ◽  
X Ray Absorption

CdSe nanocrystals (NCs), capped with trioctylphosphine oxide and 1-octadecanamine, have been synthesized with colloidal methods. Both UV–vis absorption and photoluminescence spectra show that the prepared nanostructures exhibit a quantum confinement effect. X-ray absorption near–edge structure (XANES) at Se K-edge recorded in fluorescence yield mode have been carried out on these NCs, with different size and capping ligands to gain insight into how their electronic structures are affected by the NC size and chemical properties of the ligands. The results indicate that XANES are sensitive to both the NC size and the nature of the capping ligands. The whiteline intensity in XANES spectra can be related to the photoluminescence properties of these NCs.Key words: CdSe nanocrystals, capping ligands, X-ray absorption near-edge structure, UV–vis spectroscopy, photoluminescence.

Crystalline Phases and Electronic Structures in Superconducting Bi – Sr – Ca – Cu Oxides

1997 ◽  
Vol 12 (8) ◽  
pp. 2009-2013
Author(s):  
M. D. Giardina ◽  
R. Feduzi ◽  
D. Inzaghi ◽  
A. Manara ◽  
C. Giori ◽  
...  
Keyword(s):  
Microwave Absorption ◽  
Photoelectron Spectroscopy ◽  
Electronic Structures ◽  
Theoretical Interpretation ◽  
Nominal Composition ◽  
X Ray Diffraction ◽  
Edge Structure ◽  
X Ray ◽  
Quantum Percolation ◽  
X Ray Absorption

Two classes of samples, designated A and B, of layered Bi–Sr–Ca–Cu oxides having the same nominal composition 4 : 3 : 3 : 4, but different thermal histories, were investigated by using field modulated microwave absorption (ESR), powder x-ray diffraction (XRD), x-ray photoelectron spectroscopy (XPS), and x-ray absorption near the edge structure (XANES). Previous electrical resistivity measurements showed that the B samples presented only two superconducting phases with midpoints of the transition temperatures at ∼80 K and ∼105 K. The microwave absorption technique indicated instead the presence of islands which became superconducting at the above-mentioned temperatures also in the A samples. The crystalline and electronic structures of the two types of samples are illustrated and discussed. A plausible theoretical interpretation of the experimental results, based on a quantum percolation model with Coulomb interaction, is also given.

Chromium doped ZnGa2O4 thin films: An X-ray Absorption Near Edge Structure (XANES) and X-ray Excited Optical Luminesce (XEOL) study

2021 ◽  
pp. 151896
Author(s):  
Federica Mian ◽  
Gregorio Bottaro ◽  
Zhiqiang Wang ◽  
Yun-Mui Yiu ◽  
Marzio Rancan ◽  
...  
Keyword(s):  
Thin Films ◽  
Edge Structure ◽  
X Ray ◽  
X Ray Absorption
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