X-ray absorption spectroscopy in total electron yield mode of scanning photoelectron microscopy

2005 ◽  
Vol 148 (3) ◽  
pp. 137-141 ◽  
Author(s):  
G.B. Kim ◽  
H.J. Song ◽  
H.J. Shin ◽  
C.K. Hong
Keyword(s):  
Absorption Spectroscopy ◽  
Total Electron Yield ◽  
Total Electron ◽  
X Ray ◽  
Electron Yield ◽  
Scanning Photoelectron Microscopy ◽  
X Ray Absorption ◽  
Yield Mode

Probing depth of soft x-ray absorption spectroscopy measured in total-electron-yield mode

1992 ◽  
Vol 18 (1) ◽  
pp. 65-69 ◽  
Author(s):  
M. Abbate ◽  
J. B. Goedkoop ◽  
F. M. F. de Groot ◽  
M. Grioni ◽  
J. C. Fuggle ◽  
...  
Keyword(s):  
Absorption Spectroscopy ◽  
Total Electron Yield ◽  
Total Electron ◽  
X Ray ◽  
Electron Yield ◽  
Probing Depth ◽  
X Ray Absorption ◽  
Yield Mode

scholarly journals Grazing incidence reflectivity and total electron yield effects in soft x-ray absorption spectroscopy

1997 ◽  
Vol 82 (6) ◽  
pp. 3120-3124 ◽  
Author(s):  
D. Alders ◽  
T. Hibma ◽  
G. A. Sawatzky ◽  
K. C. Cheung ◽  
G. E. van Dorssen ◽  
...  
Keyword(s):  
Absorption Spectroscopy ◽  
Grazing Incidence ◽  
Total Electron Yield ◽  
Total Electron ◽  
X Ray ◽  
Electron Yield ◽  
X Ray Absorption
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