A time- and angle-resolved X-ray photoelectron spectroscopy study of polystyrene exposed to a nitrogen plasma

R.W. Paynter; H. Benalia

doi:10.1016/j.elspec.2004.04.002

A time- and angle-resolved X-ray photoelectron spectroscopy study of polystyrene exposed to a nitrogen plasma

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/j.elspec.2004.04.002 ◽

2004 ◽

Vol 136 (3) ◽

pp. 209-220 ◽

Cited By ~ 12

Author(s):

R.W. Paynter ◽

H. Benalia

Keyword(s):

Photoelectron Spectroscopy ◽

Nitrogen Plasma ◽

Spectroscopy Study ◽

X Ray

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X-ray photoelectron spectroscopy study of the effect of hydrocarbon contamination on poly(tetrafluoroethylene) exposed to a nitrogen plasma

Langmuir ◽

10.1021/la00032a056 ◽

1993 ◽

Vol 9 (8) ◽

pp. 2240-2242 ◽

Cited By ~ 6

Author(s):

Morton A. Golub ◽

Eugene S. Lopata ◽

Lorie S. Finney

Keyword(s):

Photoelectron Spectroscopy ◽

Nitrogen Plasma ◽

Hydrocarbon Contamination ◽

Spectroscopy Study ◽

X Ray

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Surface Modification of Polystyrene Using Nitrogen Plasma. An X-ray Photoelectron Spectroscopy Study

Langmuir ◽

10.1021/la9711286 ◽

1998 ◽

Vol 14 (10) ◽

pp. 2780-2785 ◽

Cited By ~ 60

Author(s):

S. B. Idage ◽

S. Badrinarayanan

Keyword(s):

Surface Modification ◽

Photoelectron Spectroscopy ◽

Nitrogen Plasma ◽

Spectroscopy Study ◽

X Ray

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X-ray photoelectron spectroscopy study of carbon nitride coatings deposited by IR laser ablation in a remote nitrogen plasma atmosphere

Surface and Interface Analysis ◽

10.1002/sia.1110 ◽

2001 ◽

Vol 31 (9) ◽

pp. 815-824 ◽

Cited By ~ 20

Author(s):

C. Jama ◽

A. Al khawwam ◽

A-S. Loir ◽

P. Goudmand ◽

O. Dessaux ◽

...

Keyword(s):

Laser Ablation ◽

Photoelectron Spectroscopy ◽

Carbon Nitride ◽

Nitrogen Plasma ◽

Spectroscopy Study ◽

X Ray ◽

Ir Laser ◽

Nitride Coatings

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X-Ray Photoelectron Spectroscopy Study of Si-C Film Growth by Chemical Vapor Deposition of Ethylene on Si(100)

10.21236/ada197437 ◽

1988 ◽

Author(s):

P. A. Taylor ◽

M. Bozack ◽

W. J. Choyke ◽

J. T. Yates ◽

Keyword(s):

Chemical Vapor Deposition ◽

Vapor Deposition ◽

Photoelectron Spectroscopy ◽

Film Growth ◽

Chemical Vapor ◽

Spectroscopy Study ◽

X Ray

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Time‐of‐flight secondary ion mass spectrometry and X‐ray photoelectron spectroscopy study of 2‐phenylimidazole on brass

Rapid Communications in Mass Spectrometry ◽

10.1002/rcm.8974 ◽

2020 ◽

Vol 35 (2) ◽

Author(s):

Matjaž Finšgar

Keyword(s):

Mass Spectrometry ◽

Photoelectron Spectroscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Spectroscopy Study ◽

X Ray ◽

Ion Mass Spectrometry ◽

Secondary Ion

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A high-resolution X-ray photoelectron spectroscopy study of trifluoroacetic anhydride labelling of hydroxyl groups: demonstration of the β shift due to OC(O)CF3

Polymer ◽

10.1016/0032-3861(93)90418-a ◽

1993 ◽

Vol 34 (9) ◽

pp. 1795-1799 ◽

Cited By ~ 35

Author(s):

A.P. Ameen ◽

R.J. Ward ◽

R.D. Short ◽

G. Beamson ◽

D. Briggs

Keyword(s):

High Resolution ◽

Photoelectron Spectroscopy ◽

Trifluoroacetic Anhydride ◽

Hydroxyl Groups ◽

Spectroscopy Study ◽

X Ray

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An X-ray photoelectron spectroscopy study of the surface layers between diamond crystallites and silicon substrate deposited by microwave-plasma-assisted chemical vapour deposition

Diamond and Related Materials ◽

10.1016/0925-9635(93)90120-q ◽

1993 ◽

Vol 2 (2-4) ◽

pp. 558-561 ◽

Cited By ~ 5

Author(s):

S. Haq ◽

C. Somerton ◽

D. Tunnicliffe ◽

J.A. Savage ◽

P. John ◽

...

Keyword(s):

Chemical Vapour Deposition ◽

Silicon Substrate ◽

Photoelectron Spectroscopy ◽

Vapour Deposition ◽

Microwave Plasma ◽

Chemical Vapour ◽

Spectroscopy Study ◽

Surface Layers ◽

X Ray

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Combined Time-of-Flight Secondary Ion Mass Spectrometry and X-ray Photoelectron Spectroscopy Study of the Surface Segregation of Poly(methyl methacrylate) (PMMA) in Bisphenol A Polycarbonate/PMMA Blends

Macromolecules ◽

10.1021/ma00117a038 ◽

1995 ◽

Vol 28 (13) ◽

pp. 4631-4637 ◽

Cited By ~ 52

Author(s):

J.-B. Lhoest ◽

P. Bertrand ◽

L. T. Weng ◽

J.-L. Dewez

Keyword(s):

Mass Spectrometry ◽

Bisphenol A ◽

Photoelectron Spectroscopy ◽

Surface Segregation ◽

Secondary Ion Mass Spectrometry ◽

Spectroscopy Study ◽

Bisphenol A Polycarbonate ◽

X Ray ◽

Secondary Ion ◽

Pmma Blends

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X-ray photoelectron spectroscopy study of thiols adsorbed on Pt(111) with and without the presence of a copper monolayer

Surface and Interface Analysis ◽

10.1002/1096-9918(200008)30:1<359::aid-sia819>3.0.co;2-j ◽

2000 ◽

Vol 30 (1) ◽

pp. 359-363 ◽

Cited By ~ 5

Author(s):

C. Alonso ◽

M. F. L�pez ◽

A. Guti�rrez ◽

M. L. Escudero

Keyword(s):

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

X Ray

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Oxidation of Si(100) in nitric oxide at low pressures: An x-ray photoelectron spectroscopy study

Applied Physics Letters ◽

10.1063/1.119307 ◽

1997 ◽

Vol 70 (1) ◽

pp. 63-65 ◽

Cited By ~ 44

Author(s):

A. Kamath ◽

D. L. Kwong ◽

Y. M. Sun ◽

P. M. Blass ◽

S. Whaley ◽

...

Keyword(s):

Nitric Oxide ◽

Photoelectron Spectroscopy ◽

Spectroscopy Study ◽

X Ray ◽

Low Pressures

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