Integration of electrochemical and synchrotron-based X-ray techniques for in-situ investigation of aluminum anodization

2017 ◽  
Vol 241 ◽  
pp. 299-308 ◽  
Author(s):  
Fan Zhang ◽  
Jonas Evertsson ◽  
Florian Bertram ◽  
Lisa Rullik ◽  
Francesco Carla ◽  
...  
Keyword(s):  
X Ray ◽  
In Situ Investigation ◽  
Aluminum Anodization

In-situ Investigation of Bainite Formation with fast X-Ray Diffraction (iXRD)

2017 ◽  
Vol 72 (6) ◽  
pp. 355-364
Author(s):  
A. Kopp ◽  
T. Bernthaler ◽  
D. Schmid ◽  
G. Ketzer-Raichle ◽  
G. Schneider
Keyword(s):  
X Ray Diffraction ◽  
X Ray ◽  
In Situ Investigation

scholarly journals In situ investigation of degradation at organometal halide perovskite surfaces by X-ray photoelectron spectroscopy at realistic water vapour pressure

2017 ◽  
Vol 53 (37) ◽  
pp. 5231-5234 ◽  
Author(s):  
Jack Chun-Ren Ke ◽  
Alex S. Walton ◽  
David J. Lewis ◽  
Aleksander Tedstone ◽  
Paul O'Brien ◽  
...  
Keyword(s):  
Water Vapour ◽  
Photoelectron Spectroscopy ◽  
Ambient Pressure ◽  
Water Vapour Pressure ◽  
Lead Iodide ◽  
X Ray ◽  
In Situ Investigation ◽  
Organometal Halide Perovskite ◽  
Methylammonium Lead Iodide

Near-ambient-pressure X-ray photoelectron spectroscopy enables the study of the reaction of in situ-prepared methylammonium lead iodide (MAPI) perovskite at realistic water vapour pressures for the first time.

scholarly journals In Situ Investigation of the Early-Stage Growth of Nanoporous Alumina

2018 ◽  
Vol 2018 ◽  
pp. 1-9
Author(s):  
Thérèse Gorisse ◽  
Ludovic Dupré ◽  
Marc Zelsmann ◽  
Alina Vlad ◽  
Alessandro Coati ◽  
...  
Keyword(s):  
Early Stage ◽  
Grazing Incidence ◽  
Alumina Layer ◽  
Nanoporous Alumina ◽  
X Ray ◽  
X Ray Scattering ◽  
In Situ Investigation ◽  
Low X ◽  
X Ray Absorption

We report the successful use of in situ grazing incidence small-angle X-ray scattering to follow the anodization of aluminum. A dedicated electrochemical cell was designed and developed for this purpose with low X-ray absorption, with the possibility to access all azimuthal angles (360°) and to remotely control the temperature of the electrolyte. Three well-known fabrication techniques of nanoporous alumina, i.e., single, double, and pretextured, were investigated. The differences in the evolution of the scattering images are described and explained. From these measurements, we could determine at which moment the pores start growing even for very short anodization times. Furthermore, we could follow the thickness of the alumina layer as a function of the anodization time by monitoring the period of the Kiessig fringes. This work is aimed at helping to understand the different steps taking place during the anodization of aluminum at the very early stages of nanoporous alumina formation.

Direct In Situ Investigation of Milling Reactions Using Combined X-ray Diffraction and Raman Spectroscopy

2014 ◽  
Vol 54 (6) ◽  
pp. 1799-1802 ◽  
Author(s):  
Lisa Batzdorf ◽  
Franziska Fischer ◽  
Manuel Wilke ◽  
Klaus-Jürgen Wenzel ◽  
Franziska Emmerling
Keyword(s):  
Raman Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
In Situ Investigation

scholarly journals X-ray Based in Situ Investigation of Silicon Growth Mechanism Dynamics—Application to Grain and Defect Formation

Crystals ◽  
2020 ◽  
Vol 10 (7) ◽  
pp. 555 ◽  
Author(s):  
Hadjer Ouaddah ◽  
Maike Becker ◽  
Thècle Riberi-Béridot ◽  
Maria Tsoutsouva ◽  
Vasiliki Stamelou ◽  
...  
Keyword(s):  
High Temperature ◽  
Defect Formation ◽  
Imaging Techniques ◽  
Original System ◽  
Bragg Diffraction ◽  
Grain Structure ◽  
Structural Defects ◽  
X Ray ◽  
In Situ Investigation

To control the final grain structure and the density of structural crystalline defects in silicon (Si) ingots is still a main issue for Si used in photovoltaic solar cells. It concerns both innovative and conventional fabrication processes. Due to the dynamic essence of the phenomena and to the coupling of mechanisms at different scales, the post-mortem study of the solidified ingots gives limited results. In the past years, we developed an original system named GaTSBI for Growth at high Temperature observed by Synchrotron Beam Imaging, to investigate in situ the mechanisms involved during solidification. X-ray radiography and X-ray Bragg diffraction imaging (topography) are combined and implemented together with the running of a high temperature (up to 2073 K) solidification furnace. The experiments are conducted at the European Synchrotron Radiation Facility (ESRF). Both imaging techniques provide in situ and real time information during growth on the morphology and kinetics of the solid/liquid (S/L) interface, as well as on the deformation of the crystal structure and on the dynamics of structural defects including dislocations. Essential features of twinning, grain nucleation, competition, strain building, and dislocations during Si solidification are characterized and allow a deeper understanding of the fundamental mechanisms of its growth.

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