Examination of polymer/metal interface modified by self-assembled monolayer by Kelvin probe force microscopy and secondary ion mass spectrometry

Electrochimica Acta ◽

10.1016/j.electacta.2013.02.128 ◽

2013 ◽

Vol 104 ◽

pp. 462-467 ◽

Cited By ~ 4

Author(s):

M.M. Marzec ◽

A. Bernasik ◽

J. Rysz ◽

W. Łużny ◽

A. Budkowski

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Kelvin Probe Force Microscopy ◽

Metal Interface ◽

Kelvin Probe ◽

Self Assembled Monolayer ◽

Force Microscopy ◽

Ion Mass Spectrometry ◽

Polymer Metal ◽

Secondary Ion

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Combined Kelvin probe force microscopy and secondary ion mass spectrometry for hydrogen detection in corroded 2024 aluminium alloy

Electrochimica Acta ◽

10.1016/j.electacta.2013.02.063 ◽

2013 ◽

Vol 110 ◽

pp. 484-490 ◽

Cited By ~ 27

Author(s):

Céline Larignon ◽

Joël Alexis ◽

Eric Andrieu ◽

Loïc Lacroix ◽

Grégory Odemer ◽

...

Keyword(s):

Mass Spectrometry ◽

Aluminium Alloy ◽

Secondary Ion Mass Spectrometry ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Hydrogen Detection ◽

Force Microscopy ◽

Ion Mass Spectrometry ◽

Secondary Ion

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High resolution 3-D imaging for characteristics of (111)-oriented Pb(Zr0.35Ti0.65)O3 thin film by using time-of-flight secondary ion mass spectrometry and piezoresponse force microscopy

Electronic Materials Letters ◽

10.1007/s13391-011-0916-y ◽

2011 ◽

Vol 7 (3) ◽

pp. 265-270 ◽

Cited By ~ 5

Author(s):

Hyun-Chang Shin ◽

Joon-Tae Song

Keyword(s):

Thin Film ◽

Mass Spectrometry ◽

High Resolution ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Piezoresponse Force Microscopy ◽

Force Microscopy ◽

Ion Mass Spectrometry ◽

Secondary Ion

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A combination of atomic force microscopy and secondary ion mass spectrometry for investigation of AlxGa1?xAs/GaAs superlattices

Fresenius Journal of Analytical Chemistry ◽

10.1007/bf00325813 ◽

1993 ◽

Vol 345 (8-9) ◽

pp. 615-617 ◽

Cited By ~ 6

Author(s):

G. Friedbacher ◽

D. Schwarzbach ◽

P. K. Hansma ◽

H. Nickel ◽

M. Grasserbauer ◽

...

Keyword(s):

Mass Spectrometry ◽

Atomic Force Microscopy ◽

Secondary Ion Mass Spectrometry ◽

Force Microscopy ◽

Atomic Force ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Characterization of polymer surfaces and polymer-metal interfaces by static secondary ion mass spectrometry

Surface and Interface Analysis ◽

10.1002/sia.740190122 ◽

1992 ◽

Vol 19 (1-12) ◽

pp. 101-113 ◽

Cited By ~ 18

Author(s):

W. J. Van Ooij ◽

A. Sabata

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Polymer Surfaces ◽

Ion Mass Spectrometry ◽

Polymer Metal ◽

Metal Interfaces ◽

Secondary Ion

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Surface Properties of Poly(3-hydroxybutyrate-co-3- hydroxyvalerate) Banded Spherulites Studied by Atomic Force Microscopy and Time-of-Flight Secondary Ion Mass Spectrometry

Langmuir ◽

10.1021/la034865c ◽

2003 ◽

Vol 19 (18) ◽

pp. 7417-7422 ◽

Cited By ~ 27

Author(s):

Yong Jiang ◽

Jian-Jun Zhou ◽

Lin Li ◽

Jun Xu ◽

Bao-Hua Guo ◽

...

Keyword(s):

Mass Spectrometry ◽

Atomic Force Microscopy ◽

Surface Properties ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Force Microscopy ◽

Atomic Force ◽

Ion Mass Spectrometry ◽

Banded Spherulites ◽

Secondary Ion

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Thickness measurements of thin anodic oxides on GaAs using atomic force microscopy, profilometry, and secondary ion mass spectrometry

Applied Physics Letters ◽

10.1063/1.116278 ◽

1996 ◽

Vol 68 (19) ◽

pp. 2675-2677 ◽

Cited By ~ 2

Author(s):

P. Schmuki ◽

M. Buchanan ◽

B. F. Mason ◽

G. I. Sproule ◽

M. J. Graham

Keyword(s):

Mass Spectrometry ◽

Atomic Force Microscopy ◽

Secondary Ion Mass Spectrometry ◽

Force Microscopy ◽

Atomic Force ◽

Ion Mass Spectrometry ◽

Thickness Measurements ◽

Secondary Ion

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Stereoregular polypropylenes studied by time-of-flight secondary ion mass spectrometry (ToF-SIMS) and atomic force microscopy (AFM)

Surface and Interface Analysis ◽

10.1002/(sici)1096-9918(199907)27:7<659::aid-sia557>3.0.co;2-g ◽

1999 ◽

Vol 27 (7) ◽

pp. 659-669 ◽

Cited By ~ 2

Author(s):

Keyang Xu ◽

Arkady I. Gusev ◽

David M. Hercules

Keyword(s):

Mass Spectrometry ◽

Atomic Force Microscopy ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Force Microscopy ◽

Atomic Force ◽

Tof Sims ◽

Ion Mass Spectrometry ◽

Secondary Ion

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Time-of-Flight Secondary Ion Mass Spectrometry Study of Zinc Oxide Micropatterning on Self-Assembled Monolayer Template

Journal of The Electrochemical Society ◽

10.1149/1.2161547 ◽

2006 ◽

Vol 153 (3) ◽

pp. C170 ◽

Cited By ~ 13

Author(s):

N. Saito ◽

H. Haneda ◽

M. Komatsu ◽

K. Koumoto

Keyword(s):

Mass Spectrometry ◽

Zinc Oxide ◽

Secondary Ion Mass Spectrometry ◽

Time Of Flight ◽

Self Assembled Monolayer ◽

Mass Spectrometry Study ◽

Ion Mass Spectrometry ◽

Self Assembled ◽

Secondary Ion

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Thiolated cyclodextrin self-assembled monolayer-like characterized with secondary ion mass spectrometry

Applied Surface Science ◽

10.1016/j.apsusc.2010.09.020 ◽

2011 ◽

Vol 257 (6) ◽

pp. 1886-1892 ◽

Cited By ~ 5

Author(s):

L. Rabara ◽

M. Aranyosiova ◽

D. Velic

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Self Assembled Monolayer ◽

Ion Mass Spectrometry ◽

Self Assembled ◽

Secondary Ion

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Three dimensional imaging using secondary ion mass spectrometry and atomic force microscopy

Applied Surface Science ◽

10.1016/j.apsusc.2011.09.029 ◽

2011 ◽

Vol 258 (4) ◽

pp. 1322-1327 ◽

Cited By ~ 22

Author(s):

Yves Fleming ◽

Tom Wirtz ◽

Urs Gysin ◽

Thilo Glatzel ◽

Urs Wegmann ◽

...

Keyword(s):

Mass Spectrometry ◽

Atomic Force Microscopy ◽

Secondary Ion Mass Spectrometry ◽

Three Dimensional ◽

Three Dimensional Imaging ◽

Force Microscopy ◽

Atomic Force ◽

Ion Mass Spectrometry ◽

Secondary Ion

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