Understanding the effect of bromides on the stability of titanium oxide films based on a point defect model

2012 ◽  
Vol 76 ◽  
pp. 48-61 ◽  
Author(s):  
Dimitra Sazou ◽  
Kyriaki Saltidou ◽  
Michael Pagitsas
2004 ◽  
Vol 840 ◽  
Author(s):  
D. H. Kim ◽  
S. S. Kim ◽  
H. H. Lee ◽  
H. W. Jang ◽  
J. W. Kim ◽  
...  

ABSTRACTIn situ specular x-ray reflectivity was applied to study the growth kinetics of passive oxide films on iron and stainless steel substrates in pH 8.4 borate buffer solution. Under electrical potential from 0 to 800 mV, the growth rate of oxide films decreases exponentially in thickness following the direct logarithmic growth law predicted in the point defect model. The electric field in the oxide on iron is independent of the applied potentials consistent with the point defect model. In stainless steel, however, the electric field depends strongly on the applied potential indicating that the oxide properties change as the applied potential varies.


2010 ◽  
Vol 638 (1) ◽  
pp. 51-58 ◽  
Author(s):  
Román Cabrera-Sierra ◽  
José Manuel Hallen ◽  
Jorge Vazquez-Arenas ◽  
Gerardo Vázquez ◽  
Ignacio González

2001 ◽  
Vol 40 (Part 2, No. 10A) ◽  
pp. L1054-L1057 ◽  
Author(s):  
Yo Ichikawa ◽  
Kentaro Setsune ◽  
Syun-ichiro Kawashima ◽  
Koichi Kugimiya

2001 ◽  
Vol 46 (22) ◽  
pp. 3387-3396 ◽  
Author(s):  
Balaji Krishnamurthy ◽  
Ralph E. White ◽  
Harry J. Ploehn

1997 ◽  
Vol 310 (1-2) ◽  
pp. 29-33 ◽  
Author(s):  
Feng Zhang ◽  
S. Jin ◽  
Yingjun Mao ◽  
Zhihong Zheng ◽  
Yu Chen ◽  
...  

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