scholarly journals Operando soft x-ray emission spectroscopy of LiMn2O4 thin film involving Li–ion extraction/insertion reaction

2015 ◽  
Vol 50 ◽  
pp. 93-96 ◽  
Author(s):  
Daisuke Asakura ◽  
Eiji Hosono ◽  
Hideharu Niwa ◽  
Hisao Kiuchi ◽  
Jun Miyawaki ◽  
...  
Keyword(s):  
Thin Film ◽  
Emission Spectroscopy ◽  
Insertion Reaction ◽  
X Ray ◽  
Ion Extraction ◽  
Li Ion

Operando soft X-ray emission spectroscopy of the Fe2O3 anode to observe the conversion reaction

2019 ◽  
Vol 21 (48) ◽  
pp. 26351-26357 ◽  
Author(s):  
Daisuke Asakura ◽  
Yusuke Nanba ◽  
Masashi Okubo ◽  
Hideharu Niwa ◽  
Hisao Kiuchi ◽  
...  
Keyword(s):  
Thin Film ◽  
Electronic Structure ◽  
Emission Spectroscopy ◽  
Li Ion Battery ◽  
Conversion Reaction ◽  
X Ray ◽  
Structure Changes ◽  
Li Ion

Drastic electronic-structure changes in an Fe2O3 thin film anode for a Li-ion battery during discharge (lithiation) and charge (delithiation) processes were observed using operando Fe 2p soft X-ray emission spectroscopy (XES).

Mn 2p resonant X-ray emission clarifies the redox reaction and charge-transfer effects in LiMn2O4

2019 ◽  
Vol 21 (33) ◽  
pp. 18363-18369 ◽  
Author(s):  
Daisuke Asakura ◽  
Yusuke Nanba ◽  
Eiji Hosono ◽  
Masashi Okubo ◽  
Hideharu Niwa ◽  
...  
Keyword(s):  
Electronic Structure ◽  
Charge Transfer ◽  
Energy Resolution ◽  
Emission Spectroscopy ◽  
High Energy ◽  
High Energy Resolution ◽  
Transfer Effects ◽  
X Ray ◽  
Ion Extraction ◽  
Li Ion

High-energy-resolution soft X-ray emission spectroscopy (XES) was applied to understand the changes in the electronic structure of LiMn2O4 upon Li-ion extraction/insertion.

X-ray emission spectroscopy and irradiation effects on thin-film high-Tc superconductors

1990 ◽  
Vol 164-165 ◽  
pp. 1209-1215 ◽  
Author(s):  
J.-M. Mariot ◽  
V. Barnole ◽  
C.F. Hague ◽  
T. Frey ◽  
S. Siegmann ◽  
...  
Keyword(s):  
Thin Film ◽  
Emission Spectroscopy ◽  
High Tc Superconductors ◽  
Irradiation Effects ◽  
High Tc ◽  
X Ray

Lithium chromium pyrophosphate as an insertion material for Li-ion batteries

2015 ◽  
Vol 71 (6) ◽  
pp. 661-667 ◽  
Author(s):  
Martin Reichardt ◽  
Sébastien Sallard ◽  
Petr Novák ◽  
Claire Villevieille
Keyword(s):  
Sol Gel ◽  
Insertion Reaction ◽  
Li Ion Batteries ◽  
Conductivity Measurements ◽  
X Ray Diffraction ◽  
Theoretical Limit ◽  
X Ray ◽  
Electrochemically Active ◽  
Carbon Coated ◽  
Li Ion

Lithium chromium pyrophosphate (LiCrP2O7) and carbon-coated LiCrP2O7 (LiCrP2O7/C) were synthesized by solid-state and sol–gel routes, respectively. The materials were characterized by X-ray diffraction (XRD), thermogravimetric analysis (TGA), scanning electron microscopy (SEM) and conductivity measurements. LiCrP2O7 powder has a conductivity of ∼ 10−8 S cm−1, ∼ 104 times smaller than LiCrP2O7/C (∼ 10−4 S cm−1). LiCrP2O7/C is electrochemically active, mainly between 1.8 and 2.2 V versus Li+/Li (Cr3+/Cr2+ redox couple), whereas LiCrP2O7 has limited electrochemical activity. LiCrP2O7/C delivers a reversible specific charge up to ∼ 105 mAh g−1 after 100 cycles, close to the theoretical limit of 115 mAh g−1. Operando XRD experiments show slight peak shifts between 2.2 and 4.8 V versus Li+/Li, and a reversible amorphization between 1.8 and 2.2 V versus Li+/Li, suggesting an insertion reaction mechanism.

Nondestructive Study of Metal-Silicon Interfaces Using Soft X-Ray Emission Spectroscopy

1993 ◽  
Vol 320 ◽  
Author(s):  
H. Watabe ◽  
M. Iwami ◽  
M. Hirai ◽  
M. Kusaka ◽  
H. Nakamura ◽  
...  
Keyword(s):  
Thin Film ◽  
Valence Band ◽  
Emission Spectroscopy ◽  
Incident Angle ◽  
Bond Formation ◽  
Density Of State ◽  
Angle Variation ◽  
X Ray ◽  
Depth Analysis ◽  
Non Destructive

ABSTRACTSi L2,3 valence band soft x-ray emission spectrum (SXES) due to an e ectron excitation for silicides shows a clear modification from that for Si single crystal. Using this fact in combination with the incident angle variation(IAV) device, a non-destructive in-depth analysis of a Au(thin film)-Si(lll) contact is successfully carried out. Also, the SXES method has clarified the fact that a fair amount of the Si-s valence band density of state (yB-DOS) is included in the upper part of the yB-DOS for a Au-Si alloy, or Au-silicide, due to the Au-Si bond formation, which is a clear contrast to proposals given so far.

Monitoring of thin film sputtering by soft X-ray emission spectroscopy

Vacuum ◽  
1990 ◽  
Vol 41 (4-6) ◽  
pp. 1275-1278 ◽  
Author(s):  
Y. Claesson ◽  
N. Wassdahl ◽  
M. Georgson ◽  
G. Bray ◽  
C.-G. Ribbing ◽  
...  
Keyword(s):  
Thin Film ◽  
Emission Spectroscopy ◽  
X Ray

Analysis of Zinc Compound Buffer Layers in Cu(In, Ga)(S, Se)2 Thin Film Solar Cells by Synchrotron-Based Soft X-Ray Spectroscopy

2003 ◽  
Vol 763 ◽  
Author(s):  
I. Lauermann ◽  
M. Bär ◽  
A. Ennaoui ◽  
U. Fiedeler ◽  
Ch-H. Fischer ◽  
...  
Keyword(s):  
Thin Film ◽  
Photoelectron Spectroscopy ◽  
Thin Film Solar Cell ◽  
Emission Spectroscopy ◽  
Buffer Layers ◽  
Thin Film Solar Cells ◽  
Interface Properties ◽  
Specific Chemical ◽  
X Ray ◽  
Surface And Interface

AbstractZinc-based buffer layers like ZnSe, ZnS, or wet-chemically deposited ZnO on Cu(In, Ga)(S, Se)2 absorber materials (CIGSSe) have yielded thin film solar cell efficiencies comparable to or even higher than standard CdS/CIGSSe cells. However, little is known about surface and interface properties of these novel buffer layers. In this contribution we characterize the specific chemical environment at the absorber/buffer-interface using X-ray Emission Spectroscopy (XES) and Photoelectron Spectroscopy (PES) in a complementary way. Evidence of intermixing and chemical reactions is found for different buffer materials and deposition methods.

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