An additive-free electrochemical route to rapid synthesis of large-area copper nano-octahedra on gold film substrates

2009 ◽  
Vol 11 (4) ◽  
pp. 867-870 ◽  
Author(s):  
S.C. Tang ◽  
X.K. Meng ◽  
S. Vongehr
Keyword(s):  
Gold Film ◽  
Large Area ◽  
Rapid Synthesis

scholarly journals Converting plasmonic light scattering to confined light absorption and creating plexcitons by coupling a gold nano-pyramid array onto a silica–gold film

2019 ◽  
Vol 4 (2) ◽  
pp. 516-525 ◽  
Author(s):  
Peng Zheng ◽  
Sujan Kasani ◽  
Nianqiang Wu
Keyword(s):  
Light Scattering ◽  
Light Absorption ◽  
Gold Film ◽  
Large Area ◽  
Light Management

This report presents a facile microfabrication-compatible approach to fabricate a large area of plasmonic nano-pyramid array-based antennas and demonstrates effective light management by tailoring the architecture.

scholarly journals Planar narrowband Tamm plasmon-based hot-electron photodetectors with double distributed Bragg reflectors

Nano Express ◽  
2021 ◽  
Author(s):  
Weijia Shao ◽  
Tingting Liu
Keyword(s):  
Optical Absorption ◽  
Gold Film ◽  
Cost Effective ◽  
Plasmonic Nanostructures ◽  
Bragg Reflectors ◽  
Hot Electron ◽  
Distributed Bragg Reflectors ◽  
Large Area ◽  
Electron Collection ◽  
Sustained Performance

Abstract Hot-electron photodetectors (HE PDs) are attracting a great deal of attention from plasmonic community. Many efficient HE PDs with various plasmonic nanostructures have been demonstrated, but their preparations usually rely on complicated and costly fabrication techniques. Planar HE PDs are viewed as potential candidates of cost-effective and large-area applications, but they likely fail in the simultaneous achievement of outstanding optical absorption and hot-electron collection. To reconcile the contradiction between optical and electrical requirements, herein, we propose a planar HE PD based on optical Tamm plasmons (TPs) consisted of an ultrathin gold film (10 nm) sandwiched between two distributed Bragg reflectors (DBRs). Simulated results show that strong optical absorption (>0.95) in the ultrathin Au film is realized. Electrical calculations show that the predicted peak photo-responsivity of proposed HE PD with double DBRs is over two times larger than that of conventional single-DBR HE PD. Moreover, the planar dual-DBR HE PDs exhibit a narrowband photodetection functionality and sustained performance under oblique incidences. The optical nature associated with TP resonance is elaborated.

Controllable and Rapid Synthesis of High-Quality and Large-Area Bernal Stacked Bilayer Graphene Using Chemical Vapor Deposition

2013 ◽  
Vol 26 (2) ◽  
pp. 907-915 ◽  
Author(s):  
Wei Liu ◽  
Stephan Kraemer ◽  
Deblina Sarkar ◽  
Hong Li ◽  
Pulickel M. Ajayan ◽  
...  
Keyword(s):  
Chemical Vapor Deposition ◽  
Vapor Deposition ◽  
Chemical Vapor ◽  
Bilayer Graphene ◽  
Large Area ◽  
High Quality ◽  
Rapid Synthesis

Gold-film coating assisted femtosecond laser fabrication of large-area, uniform periodic surface structures

2015 ◽  
Vol 54 (6) ◽  
pp. 1314 ◽  
Author(s):  
Pin Feng ◽  
Lan Jiang ◽  
Xin Li ◽  
Wenlong Rong ◽  
Kaihu Zhang ◽  
...  
Keyword(s):  
Femtosecond Laser ◽  
Gold Film ◽  
Film Coating ◽  
Surface Structures ◽  
Large Area ◽  
Laser Fabrication ◽  
Periodic Surface

Convergent Beam Electron Diffraction

1978 ◽  
Vol 36 (3) ◽  
pp. 304-315
Author(s):  
G. Lehmpfuhl
Keyword(s):  
Electron Diffraction ◽  
Diffraction Pattern ◽  
Crystal Surface ◽  
Diffraction Spot ◽  
Crystal Thickness ◽  
Large Area ◽  
Electron Microscopic ◽  
Additional Information ◽  
Microscopic Investigations

Introduction In electron microscopic investigations of crystalline specimens the direct observation of the electron diffraction pattern gives additional information about the specimen. The quality of this information depends on the quality of the crystals or the crystal area contributing to the diffraction pattern. By selected area diffraction in a conventional electron microscope, specimen areas as small as 1 µ in diameter can be investigated. It is well known that crystal areas of that size which must be thin enough (in the order of 1000 Å) for electron microscopic investigations are normally somewhat distorted by bending, or they are not homogeneous. Furthermore, the crystal surface is not well defined over such a large area. These are facts which cause reduction of information in the diffraction pattern. The intensity of a diffraction spot, for example, depends on the crystal thickness. If the thickness is not uniform over the investigated area, one observes an averaged intensity, so that the intensity distribution in the diffraction pattern cannot be used for an analysis unless additional information is available.

Contrast from epitaxially sandwiched macromolecules

1978 ◽  
Vol 36 (2) ◽  
pp. 226-227
Author(s):  
M. Talianker ◽  
D.G. Brandon
Keyword(s):  
Gold Film ◽  
Lattice Defect ◽  
Gold Foil ◽  
Specimen Preparation ◽  
Preparation Technique ◽  
Resolution Limit ◽  
Transmission Electron ◽  
Crystal Lattice Defect ◽  
Void Effect ◽  
Lattice Resolution

A new specimen preparation technique for visualizing macromolecules by conventional transmission electron microscopy has been developed. In this technique the biopolymer-molecule is embedded in a thin monocrystalline gold foil. Such embedding can be performed in the following way: the biopolymer is deposited on an epitaxially-grown thin single-crystal gold film. The molecule is then occluded by further epitaxial growth. In such an epitaxial sandwich an occluded molecule is expected to behave as a crystal-lattice defect and give rise to contrast in the electron microscope.The resolution of the method should be limited only by the precision with which the epitaxially grown gold reflects the details of the molecular structure and, in favorable cases, can approach the lattice resolution limit.In order to estimate the strength of the contrast due to the void-effect arising from occlusion of the DNA-molecule in a gold crystal some calculations were performed.

TEM Study of a Tilt Boundary in Hot-Pressed Silicon

1981 ◽  
Vol 39 ◽  
pp. 160-161
Author(s):  
C. B. Carter ◽  
J. Rose ◽  
D. G. Ast
Keyword(s):  
Electron Diffraction ◽  
Imaging Technique ◽  
Interface Structure ◽  
Large Area ◽  
Weak Beam ◽  
Lattice Fringe ◽  
Electron Diffraction Technique ◽  
Tilt Boundaries ◽  
Beam Technique ◽  
Twist Boundaries

The hot-pressing technique which has been successfully used to manufacture twist boundaries in silicon has now been used to form tilt boundaries in this material. In the present study, weak-beam imaging, lattice-fringe imaging and electron diffraction techniques have been combined to identify different features of the interface structure. The weak-beam technique gives an overall picture of the geometry of the boundary and in particular allows steps in the plane of the boundary which are normal to the dislocation lines to be identified. It also allows pockets of amorphous SiO2 remaining in the interface to be recognized. The lattice-fringe imaging technique allows the boundary plane parallel to the dislocation to be identified. Finally the electron diffraction technique allows the periodic structure of the boundary to be evaluated over a large area - this is particularly valuable when the dislocations are closely spaced - and can also provide information on the structural width of the interface.

P20 phosphor on polyimide as a large area high-resolution transmission screen for slow scan CCD systems

1995 ◽  
Vol 53 ◽  
pp. 20-21
Author(s):  
C. C. Ahn ◽  
S. Karnes ◽  
M. Lvovsky ◽  
C. M. Garland ◽  
H. A. Atwater ◽  
...  
Keyword(s):  
Mechanical Stability ◽  
High Energy ◽  
Practical Implementation ◽  
Line Pair ◽  
Modulation Transfer ◽  
Large Area ◽  
Ccd Imaging ◽  
Transmission Electron ◽  
The One ◽  
Beam Broadening

The bane of CCD imaging systems for transmission electron microscopy at intermediate and high voltages has been their relatively poor modulation transfer function (MTF), or line pair resolution. The problem originates primarily with the phosphor screen. On the one hand, screens should be thick so that as many incident electrons as possible are converted to photons, yielding a high detective quantum efficiency(DQE). The MTF diminishes as a function of scintillator thickness however, and to some extent as a function of fluorescence within the scintillator substrates. Fan has noted that the use of a thin layer of phosphor beneath a self supporting 2μ, thick Al substrate might provide the most appropriate compromise for high DQE and MTF in transmission electron microcscopes which operate at higher voltages. Monte Carlo simulations of high energy electron trajectories reveal that only little beam broadening occurs within this thickness of Al film. Consequently, the MTF is limited predominantly by broadening within the thin phosphor underlayer. There are difficulties however, in the practical implementation of this design, associated mostly with the mechanical stability of the Al support film.

Study of Tip-Surface Interactions in Scanning Tunneling Microscopy (STM) by Reflection Electron Microscopy (REM)

1990 ◽  
Vol 48 (1) ◽  
pp. 320-321
Author(s):  
W. Lo ◽  
J.C.H. Spence ◽  
M. Kuwabara
Keyword(s):  
High Resolution ◽  
Elastic Strain ◽  
Tunneling Current ◽  
Surface Damage ◽  
Surface Interactions ◽  
Graphite Surface ◽  
Scanning Tunneling ◽  
Large Area ◽  
Tunneling Microscopy ◽  
High Resolution Tem

Work on the integration of STM with REM has demonstrated the usefulness of this combination. The STM has been designed to replace the side entry holder of a commercial Philips 400T TEM. It allows simultaneous REM imaging of the tip/sample region of the STM (see fig. 1). The REM technique offers nigh sensitivity to strain (<10−4) through diffraction contrast and high resolution (<lnm) along the unforeshortened direction. It is an ideal technique to use for studying tip/surface interactions in STM.The elastic strain associated with tunnelling was first imaged on cleaved, highly doped (S doped, 5 × 1018cm-3) InP(110). The tip and surface damage observed provided strong evidence that the strain was caused by tip/surface contact, most likely through an insulating adsorbate layer. This is consistent with the picture that tunnelling in air, liquid or ordinary vacuum (such as in a TEM) occurs through a layer of contamination. The tip, under servo control, must compress the insulating contamination layer in order to get close enough to the sample to tunnel. The contaminant thereby transmits the stress to the sample. Elastic strain while tunnelling from graphite has been detected by others, but never directly imaged before. Recent results using the STM/REM combination has yielded the first direct evidence of strain while tunnelling from graphite. Figure 2 shows a graphite surface elastically strained by the STM tip while tunnelling (It=3nA, Vtip=−20mV). Video images of other graphite surfaces show a reversible strain feature following the tip as it is scanned. The elastic strain field is sometimes seen to extend hundreds of nanometers from the tip. Also commonly observed while tunnelling from graphite is an increase in the RHEED intensity of the scanned region (see fig.3). Debris is seen on the tip and along the left edges of the brightened scan region of figure 4, suggesting that tip abrasion of the surface has occurred. High resolution TEM images of other tips show what appear to be attached graphite flakes. The removal of contamination, possibly along with the top few layers of graphite, seems a likely explanation for the observed increase in RHEED reflectivity. These results are not inconsistent with the “sliding planes” model of tunnelling on graphite“. Here, it was proposed that the force due to the tunnelling probe acts over a large area, causing shear of the graphite planes when the tip is scanned. The tunneling current is then modulated as the planes of graphite slide in and out of registry. The possiblity of true vacuum tunnelling from the cleaned graphite surface has not been ruled out. STM work function measurements are needed to test this.

Modified Solid-Phase Methods for the Rapid Synthesis of Opioid Peptides

1991 ◽  
Author(s):  
Richard A. Houghten ◽  
◽  
John M. Ostresh ◽  
Suzanne M. Pratt
Keyword(s):  
Opioid Peptides ◽  
Solid Phase ◽  
Rapid Synthesis
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