Ex situ atomic force microscopy of bismuth film deposition at carbon paste electrodes

2005 ◽  
Vol 7 (11) ◽  
pp. 1091-1097 ◽  
Author(s):  
Gerd-Uwe Flechsig ◽  
Mike Kienbaum ◽  
Peter Gründler
Keyword(s):  
Atomic Force Microscopy ◽  
Film Deposition ◽  
Ex Situ ◽  
Bismuth Film ◽  
Carbon Paste ◽  
Force Microscopy ◽  
Carbon Paste Electrodes ◽  
Atomic Force

Ex Situ and In Situ Thermal Transformations of M-50 Pitch Revealed by Non-contact Atomic Force Microscopy

2021 ◽  
Author(s):  
Pengcheng Chen ◽  
Jordan N. Metz ◽  
Adam S. Gross ◽  
Stuart E. Smith ◽  
Steven P. Rucker ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ex Situ ◽  
Thermal Transformations ◽  
Force Microscopy ◽  
Atomic Force

Ex situ atomic force microscopy studies of growth mechanisms of cadmium mercury thiocyanate crystals

2002 ◽  
Vol 234 (2-3) ◽  
pp. 480-486 ◽  
Author(s):  
X.N. Jiang ◽  
D. Xu ◽  
D.L. Sun ◽  
D.R. Yuan ◽  
M.K. Lu ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Ex Situ ◽  
Growth Mechanisms ◽  
Force Microscopy ◽  
Atomic Force

ATOMIC FORCE MICROSCOPY STUDIES ON GROWTH STEPS AND 2D NUCLEI ON THE {100} FACES OF DEUTERATED L-ARGININE PHOSPHATE CRYSTALS

2004 ◽  
Vol 11 (04n05) ◽  
pp. 379-383 ◽  
Author(s):  
Y. L. GENG ◽  
D. XU ◽  
D. L. SUN ◽  
W. DU ◽  
H. Y. LIU ◽  
...  
Keyword(s):  
Growth Rate ◽  
Atomic Force Microscopy ◽  
Growth Mechanism ◽  
Layer Growth ◽  
Ex Situ ◽  
Force Microscopy ◽  
Atomic Force

Growth steps and 2D nuclei of the {100} faces of the deuterated L-arginine phosphate (DLAP) crystals have been studied using ex-situ atomic force microscopy (AFM). Straight steps along the b direction as well as meandered steps are detected. The bunched steps have wider terraces than the elementary ones, which are supposed to result from the slower growth rate of the former than the latter. Many 2D nuclei exist on the step terraces and edges acting as the growth sources. Occasionally, 2D islands generated by 2D nuclei could also be observed. In conclusion, the crystal grows by layer growth mechanism.

EX SITU ATOMIC FORCE MICROSCOPY STUDIES OF SURFACE MORPHOLOGY ON {001} FACES OF MMTWD CRYSTALS

2006 ◽  
Vol 13 (05) ◽  
pp. 607-611
Author(s):  
X. J. LIU ◽  
X. Q. WANG ◽  
Z. Y. WANG ◽  
D. XU ◽  
G. W. YU ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Atomic Force Microscopy ◽  
Surface Morphology ◽  
Temperature Stress ◽  
Growth Rates ◽  
High Density ◽  
Ex Situ ◽  
Force Microscopy ◽  
Elementary Steps ◽  
Atomic Force

Surface morphology of the {001} faces of MMTWD crystals grown from by the temperature-lowering method has been studied. Monolayer and multilayer steps elongate along the a direction, which is determined by the crystal structure. Apart from that, the elementary steps have narrower terraces than the bunched ones, which may be resulting from the faster growth rates of the former than the latter. The formation of the protuberances at the step fronts is primarily associated with the uneven growth rates. The hollow cavities also elongate along the a direction, which demonstrates that the formation of them is also restricted by the crystal structure. Cracks are supposed to occur during harvesting, handling, or temperature stress afterwards. Growth of the 3D hillocks in high density can probably cause large stress and induce structure mismatch and serious cracks at the later stage.

Kinetics of Crystal Nucleation and Growth in Thin Films of Amorphous Te Alloys measured by Atomic Force Microscopy

2003 ◽  
Vol 803 ◽  
Author(s):  
J. Kalb ◽  
F. Spaepen ◽  
M. Wuttig
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Data Storage ◽  
Optical Data Storage ◽  
Crystal Nucleation ◽  
Ex Situ ◽  
Optical Data ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTBoth the crystal nucleation rate and the crystal growth velocity of sputtered amorphous Ag0.055In0.065Sb0.59Te0.29 and Ge4Sb1Te5 thin films used for optical data storage were determined as a function of temperature. Crystals were directly observed using ex-situ atomic force microscopy, and their change in size after each anneal was measured. Between 140°C and 185°C, these materials exhibited similar crystal growth characteristics, but differed in their crystal nucleation characteristics. These observations provide an explanation for the different re-crystallization mechanisms observed upon laser-induced crystallization of amorphous marks.

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