Non-destructive identification of inorganic pigments used in 16–17th century Albanian icons by total reflection X-ray fluorescence analysis

2006 ◽  
Vol 7 (4) ◽  
pp. 339-343 ◽  
Author(s):  
N. Civici
Keyword(s):  
Fluorescence Analysis ◽  
17Th Century ◽  
Total Reflection ◽  
Inorganic Pigments ◽  
X Ray ◽  
Non Destructive

Ultra-microanalysis of inorganic pigments on painted objects by total reflection X-ray fluorescence analysis

1995 ◽  
Vol 40 (3) ◽  
pp. 153-162 ◽  
Author(s):  
W. Devos ◽  
L. Moens ◽  
A. von Bohlen ◽  
R. Klockenkämper
Keyword(s):  
Fluorescence Analysis ◽  
Total Reflection ◽  
Inorganic Pigments ◽  
X Ray

Ultra-Microanalysis of Inorganic Pigments on Painted Objects by Total Reflection X-Ray Fluorescence Analysis

1995 ◽  
Vol 40 (3) ◽  
pp. 153 ◽  
Author(s):  
W. Devos ◽  
L. Moens ◽  
A. von Bohlen ◽  
R. Klockenkämper ◽  
R. Klockenkamper
Keyword(s):  
Fluorescence Analysis ◽  
Total Reflection ◽  
Inorganic Pigments ◽  
X Ray

scholarly journals Modular MA-XRF Scanner Development in the Multi-Analytical Characterisation of a 17th Century Azulejo from Portugal

Sensors ◽  
2021 ◽  
Vol 21 (5) ◽  
pp. 1913
Author(s):  
Sergio Augusto Barcellos Lins ◽  
Marta Manso ◽  
Pedro Augusto Barcellos Lins ◽  
Antonio Brunetti ◽  
Armida Sodo ◽  
...  
Keyword(s):  
Monte Carlo ◽  
Monte Carlo Simulations ◽  
17Th Century ◽  
Scanning System ◽  
X Ray ◽  
Portable Instruments ◽  
Complementary Techniques ◽  
Non Destructive ◽  
Suitable Technique ◽  
Cobalt Blue

A modular X-ray scanning system was developed, to fill in the gap between portable instruments (with a limited analytical area) and mobile instruments (with large analytical areas, and sometimes bulky and difficult to transport). The scanner has been compared to a commercial tabletop instrument, by analysing a Portuguese tile (azulejo) from the 17th century. Complementary techniques were used to achieve a throughout characterisation of the sample in a complete non-destructive approach. The complexity of the acquired X-ray fluorescence (XRF) spectra, due to inherent sample stratigraphy, has been resolved using Monte Carlo simulations, and Raman spectroscopy, as the most suitable technique to complement the analysis of azulejos colours, yielding satisfactory results. The colouring agents were identified as cobalt blue and a Zn-modified Naples-yellow. The stratigraphy of the area under study was partially modelled with Monte Carlo simulations. The scanners performance has been compared by evaluating the images outputs and the global spectrum.

scholarly journals Non-destructive handheld XRF study of archaeological composite silver objects—the case study of the late Roman Seuso Treasure

2021 ◽  
Vol 13 (5) ◽  
Author(s):  
Viktória Mozgai ◽  
Bernadett Bajnóczi ◽  
Zoltán May ◽  
Zsolt Mráv
Keyword(s):  
Fluorescence Analysis ◽  
The Body ◽  
High Quality ◽  
X Ray ◽  
Composite Objects ◽  
Mechanical Attachment ◽  
Non Destructive ◽  
Made In ◽  
Late Roman

AbstractThis study details the non-destructive chemical analysis of composite silver objects (ewers, situlas, amphora and casket) from one of the most significant late Roman finds, the Seuso Treasure. The Seuso Treasure consists of fourteen large silver vessels that were made in the fourth–early fifth centuries AD and used for dining during festive banquets and for washing and beautification. The measurements were systematically performed along a pre-designed grid at several points using handheld X-ray fluorescence analysis. The results demonstrate that all the objects were made from high-quality silver (above 90 wt% Ag), with the exception of the base of the Geometric Ewer B. Copper was added intentionally to improve the mechanical properties of soft silver. The gold and lead content of the objects shows constant values (less than 1 wt% Au and Pb). The chemical composition as well as the Bi/Pb ratio suggests that the parts of the composite objects were manufactured from different silver ingots. The ewers were constructed in two ways: (i) the base and the body were made separately, or (ii) the ewer was raised from a single silver sheet. The composite objects were assembled using three methods: (i) mechanical attachment; (ii) low-temperature, lead-tin soft solders; or (iii) high-temperature, copper-silver hard solders. Additionally, two types of gilding were revealed by the XRF analysis, one with remnants of mercury, i.e. fire-gilding, and another type without remnants of mercury, presumably diffusion bonding.

How to Use the Features of Total Reflection of X-Rays for Energy Dispersive XRF

1988 ◽  
Vol 32 ◽  
pp. 105-114 ◽  
Author(s):  
H. Schwenke ◽  
W. Berneike ◽  
J. Knoth ◽  
U. Weisbrod
Keyword(s):  
Thin Films ◽  
Penetration Depth ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
X Rays ◽  
X Ray ◽  
Characteristic Features ◽  
Respective Characteristic ◽  
Nanometer Regime ◽  
Sensitive Method

AbstractThe total reflection of X-rays is mainly determined by three parameters , that is the orltical angle, the reflectivity and the penetration depth. For X-ray fluorescence analysis the respective characteristic features can be exploited in two rather different fields of application. In the analysis of trace elements in samples placed as thin films on optical flats, detection limits as low as 2 pg or 0.05 ppb, respectively, have been obtained. In addition, a penetration depth in the nanometer regime renders Total Reflection XRF an inherently sensitive method for the elemental analysis of surfaces. This paper outlines the main physical and constructional parameters for instrumental design and quantitation in both branches of TXRF.

Update On Synchrotron Radiation TXRF: New Results

1998 ◽  
Vol 524 ◽  
Author(s):  
S. Brennan ◽  
P. Pianetta ◽  
S. Ghosh ◽  
N. Takaura ◽  
C. Wiemer ◽  
...  
Keyword(s):  
Synchrotron Radiation ◽  
Total Reflection ◽  
Synchrotron Source ◽  
X Ray ◽  
Non Destructive

ABSTRACTSynchrotron-based total-reflection x-ray fluorescence(SR-TXRF) has been developed as a leading technique for measuring wafer cleanliness. It holds advantages over other techniques in that it is non-destructive and allows mapping of the surface. The highest sensitivity observed thus far is 3x108 atoms/cm 2 (- 3fg) for 1000 second count time. Several applications of SR-TXRF are presented which take advantage of the energy tunability of the synchrotron source or the mapping capability.

Selective Mercury Determination after Membrane Complexation and Total Reflection X-ray Fluorescence Analysis

2004 ◽  
Vol 76 (15) ◽  
pp. 4315-4319 ◽  
Author(s):  
Pavlos E. Koulouridakis ◽  
Nikolaos G. Kallithrakas-Kontos
Keyword(s):  
Fluorescence Analysis ◽  
Total Reflection ◽  
Mercury Determination ◽  
X Ray

Trace Element Determination in Diesel Particulates by Total-Reflection X-Ray Fluorescence Analysis

1999 ◽  
Vol 131 (3-4) ◽  
pp. 219-223 ◽  
Author(s):  
Juha K. Vilhunen ◽  
Alex von Bohlen ◽  
Martina Schmeling ◽  
Leena Rantanen ◽  
Seppo Mikkonen ◽  
...  
Keyword(s):  
Trace Element ◽  
Fluorescence Analysis ◽  
Total Reflection ◽  
Trace Element Determination ◽  
Element Determination ◽  
X Ray

Main Peak Profiles of Total Reflection X-Ray Fluorescence Analysis of Si(001) Wafers Excited by Monochromatic X-Ray Beam W-Lβ (II)

1993 ◽  
Vol 32 (Part 1, No. 3A) ◽  
pp. 1191-1196 ◽  
Author(s):  
Kenji Yakushiji ◽  
Shinji Ohkawa ◽  
Atsushi Yoshinaga ◽  
Jimpei Harada
Keyword(s):  
Fluorescence Analysis ◽  
Total Reflection ◽  
Main Peak ◽  
X Ray
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