Theoretical electronic structure of the molecules SrX (X = Li, Na, K) toward laser cooling study

2018 ◽  
Vol 1126 ◽  
pp. 16-32 ◽  
Author(s):  
Israa Zeid ◽  
Tanya Atallah ◽  
Sahar Kontar ◽  
Wael Chmaisani ◽  
Nayla El-Kork ◽  
...  
2021 ◽  
Vol 23 (1) ◽  
pp. 013017
Author(s):  
Amal Moussa ◽  
Nayla El-Kork ◽  
Mahmoud Korek

Author(s):  
Wael Chmaisani ◽  
Soumaya Hashem Elmoussaoui

The feasibility of the thallium monofluoride TlF+ molecular ion towards laser cooling is brought into focus throughout an electronic structure study. Ab-initio calculations are carried out to investigate the four...


2018 ◽  
Vol 1134 ◽  
pp. 8-14 ◽  
Author(s):  
Yun-Guang Zhang ◽  
Ge Dou ◽  
Jian-Xia Qi ◽  
Jie Cui

Author(s):  
S.J. Splinter ◽  
J. Bruley ◽  
P.E. Batson ◽  
D.A. Smith ◽  
R. Rosenberg

It has long been known that the addition of Cu to Al interconnects improves the resistance to electromigration failure. It is generally accepted that this improvement is the result of Cu segregation to Al grain boundaries. The exact mechanism by which segregated Cu increases service lifetime is not understood, although it has been suggested that the formation of thin layers of θ-CuA12 (or some metastable substoichiometric precursor, θ’ or θ”) at the boundaries may be necessary. This paper reports measurements of the local electronic structure of Cu atoms segregated to Al grain boundaries using spatially resolved EELS in a UHV STEM. It is shown that segregated Cu exists in a chemical environment similar to that of Cu atoms in bulk θ-phase precipitates.Films of 100 nm thickness and nominal composition Al-2.5wt%Cu were deposited by sputtering from alloy targets onto NaCl substrates. The samples were solution heat treated at 748K for 30 min and aged at 523K for 4 h to promote equilibrium grain boundary segregation. EELS measurements were made using a Gatan 666 PEELS spectrometer interfaced to a VG HB501 STEM operating at 100 keV. The probe size was estimated to be 1 nm FWHM. Grain boundaries with the narrowest projected width were chosen for analysis. EDX measurements of Cu segregation were made using a VG HB603 STEM.


Author(s):  
J. Fink

Conducting polymers comprises a new class of materials achieving electrical conductivities which rival those of the best metals. The parent compounds (conjugated polymers) are quasi-one-dimensional semiconductors. These polymers can be doped by electron acceptors or electron donors. The prototype of these materials is polyacetylene (PA). There are various other conjugated polymers such as polyparaphenylene, polyphenylenevinylene, polypoyrrole or polythiophene. The doped systems, i.e. the conducting polymers, have intersting potential technological applications such as replacement of conventional metals in electronic shielding and antistatic equipment, rechargable batteries, and flexible light emitting diodes.Although these systems have been investigated almost 20 years, the electronic structure of the doped metallic systems is not clear and even the reason for the gap in undoped semiconducting systems is under discussion.


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