Parametric failure manifolds for laminated composites

2020 ◽  
Vol 253 ◽  
pp. 112798
Author(s):  
Bassam El Said ◽  
Stephen R. Hallett
2005 ◽  
Vol 126 ◽  
pp. 147-150 ◽  
Author(s):  
C. Barthod ◽  
G. Gautier ◽  
Y. Teisseyre ◽  
A. Agbossou

Author(s):  
Alexander Ivanovich Oleinikov ◽  
Tatiana Andreevna Kuzmina
Keyword(s):  

Author(s):  
Chunlei Wu ◽  
Suying Yao

Abstract Lock-in IR-OBIRCH analysis, as a kind of static thermal laser stimulation (S-TLS) technique, is very effective to isolate a fault for the parametric failure cases. However, its capability is limited to localize a defect when the IC is operated under a defined operating condition. Whereas the dynamic thermal laser stimulation (D-TLS) technique is good at locating a fault while the IC is operated under some functions to activate the failure. In this paper, a novel method is presented to realize DTLS just by Lock-in IR-OBIRCH assisted with a Current Detection Probe Head. Two cases are studied to demonstrate the effectiveness of this method.


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