Three-dimensional exact electric-elastic analysis of a multilayered two-dimensional decagonal quasicrystal plate subjected to patch loading

2017 ◽  
Vol 171 ◽  
pp. 198-216 ◽  
Author(s):  
Lianzhi Yang ◽  
Yang Li ◽  
Yang Gao ◽  
Ernian Pan ◽  
Natalie Waksmanski
Keyword(s):  
Three Dimensional ◽  
Elastic Analysis ◽  
Two Dimensional ◽  
Decagonal Quasicrystal ◽  
Patch Loading

A method for the derivation of load effect envelopes based on statistical considerations

1993 ◽  
Vol 20 (2) ◽  
pp. 201-209
Author(s):  
Eugene J. O'Brien ◽  
Robert E. Loov
Keyword(s):  
Structural Analysis ◽  
Three Dimensional ◽  
Elastic Analysis ◽  
Two Dimensional ◽  
Statistical Parameters ◽  
Simple Method ◽  
Load Effect ◽  
Linear Elastic ◽  
Derived Design ◽  
Usual Process

A simple method is proposed as a substitute for the usual process of factoring loads, performing a linear elastic analysis, and determining an envelope of the results. The method is based on statistical principles, but only a minimum knowledge of statistics is required for its use. It involves conventional structural analysis followed by some processing of the results which could readily be incorporated into existing computer programs.The practice of performing two-dimensional analyses on parts of three-dimensional structures is possible with the proposed approach. The implications are clarified and the necessary statistical parameters are derived.Deterministically derived design envelopes represent all the extremes of loading that can reasonably be considered. The envelopes found by the new method not only reflect loading variations but also consider their relative probabilities of occurrence so that excursions beyond the envelope are expected to be equally infrequent along the entire length of the structure. Inconsistencies inherent in the conventional approach are highlighted by comparison with the proposed method for a number of examples. Key words: probabilistic, safety, load, imposed load, load effect envelope, building.

Electric–elastic analysis of multilayered two-dimensional decagonal quasicrystal circular plates with simply supported or clamped boundary conditions

2021 ◽  
pp. 108128652098161
Author(s):  
Yunzhi Huang ◽  
Min Zhao ◽  
Miaolin Feng
Keyword(s):  
Boundary Conditions ◽  
Electric Fields ◽  
Radial Coordinate ◽  
Elastic Analysis ◽  
Two Dimensional ◽  
Circular Plates ◽  
State Equations ◽  
Element Analysis ◽  
Decagonal Quasicrystal ◽  
Simply Supported

A three-dimensional (3D) electric–elastic analysis of multilayered two-dimensional decagonal quasicrystal (QC) circular plates with simply supported or clamped boundary conditions is presented through a state vector approach. Both perfect and imperfect bonds between the layers are considered by adjusting the parameter sets in the model. Governing equations for the plates subjected to electric or elastic load on the bottom surfaces are derived using the state equations and the propagator matrix method. We explicitly obtain the analytical solution by writing the physical variables as Bessel series expansions and polynomial functions with respect to the radial coordinate. The solution is validated by comparing the numerical results with the 3D finite element analysis. The basic physical quantities of the plates in the phonon, phason, and electric fields are computed in the numerical examples. Result shows that the QC layers as coatings decrease the deflection in the phonon and phason fields of plates. The phonon–phason coupling elastic modulus and piezoelectric constant produce positive and negative effects on the magnitudes of stresses. Besides, compliance coefficients of the weak interface in the phonon field contribute more to the variations than those in the phason field.

Elasto-plastic Matrix Displacement Analysis of Three-dimensional Continua

1965 ◽  
Vol 69 (657) ◽  
pp. 633-636 ◽  
Author(s):  
J . H. Argyris
Keyword(s):  
Three Dimensional ◽  
Stress And Strain ◽  
Elastic Analysis ◽  
Large Displacements ◽  
Two Dimensional ◽  
Displacement Method ◽  
Plastic Analysis ◽  
The Matrix ◽  
New Ideas ◽  
Plastic Matrix

The author presented in his recent main lecture to the Society, “The Computer Shapes the Theory”, a number of novel developments in the matrix displacement method. Since the publication of the lecture and discussion will inevitably be delayed and cannot but illustrate the application of the new ideas on a series of examples, he has been repeatedly urged to summarise some of the more important theoretical contributions in the form of Technical Notes. The first deals with the elasto-plastic analysis, in the presence of strain hardening, of arbitrary three-dimensional configurations. The reader is assumed to be familiar with the corresponding elastic analysis given in refs. 2 and 3, where the medium is represented by a suitable assembly of tetrahedra under constant stress and strain. The corresponding two-dimensional case is investigated on the basis of triangles. Arbitrary anisotropic behaviour and large displacements were also included in refs. 2 and 3.

High Resolution Microscopy of Multi-Layered Biological Crystals

1982 ◽  
Vol 40 ◽  
pp. 80-83
Author(s):  
H.A. Cohen ◽  
T.W. Jeng ◽  
W. Chiu
Keyword(s):  
High Resolution ◽  
Low Dose ◽  
Three Dimensional ◽  
Data Interpretation ◽  
Two Dimensional ◽  
Biological Objects ◽  
Density Maps ◽  
Density Map ◽  
Complex Crystal ◽  
High Resolution Microscopy

This tutorial will discuss the methodology of low dose electron diffraction and imaging of crystalline biological objects, the problems of data interpretation for two-dimensional projected density maps of glucose embedded protein crystals, the factors to be considered in combining tilt data from three-dimensional crystals, and finally, the prospects of achieving a high resolution three-dimensional density map of a biological crystal. This methodology will be illustrated using two proteins under investigation in our laboratory, the T4 DNA helix destabilizing protein gp32*I and the crotoxin complex crystal.

Instrumentation For Quantitative Microscopy

1977 ◽  
Vol 35 ◽  
pp. 206-209
Author(s):  
B. Ralph ◽  
A.R. Jones
Keyword(s):  
Volume Fraction ◽  
Three Dimensional ◽  
Two Dimensional ◽  
Automatic Data ◽  
Phase Volume Fraction ◽  
Statistical Confidence ◽  
Resultant Data ◽  
Automatic Data Collection ◽  
Third Dimension ◽  
Evolution Of Microstructure

In all fields of microscopy there is an increasing interest in the quantification of microstructure. This interest may stem from a desire to establish quality control parameters or may have a more fundamental requirement involving the derivation of parameters which partially or completely define the three dimensional nature of the microstructure. This latter categorey of study may arise from an interest in the evolution of microstructure or from a desire to generate detailed property/microstructure relationships. In the more fundamental studies some convolution of two-dimensional data into the third dimension (stereological analysis) will be necessary.In some cases the two-dimensional data may be acquired relatively easily without recourse to automatic data collection and further, it may prove possible to perform the data reduction and analysis relatively easily. In such cases the only recourse to machines may well be in establishing the statistical confidence of the resultant data. Such relatively straightforward studies tend to result from acquiring data on the whole assemblage of features making up the microstructure. In this field data mode, when parameters such as phase volume fraction, mean size etc. are sought, the main case for resorting to automation is in order to perform repetitive analyses since each analysis is relatively easily performed.

A linearity test for thick specimens imaged by HVEM over a 180° angular range

1991 ◽  
Vol 49 ◽  
pp. 552-553
Author(s):  
Yu Liu
Keyword(s):  
Phase Contrast ◽  
Three Dimensional ◽  
Angular Range ◽  
Two Dimensional ◽  
Back Projection ◽  
Line Integral ◽  
Exponential Law ◽  
Transmission Electron ◽  
Absorption Law ◽  
Linearity Test

The image obtained in a transmission electron microscope is the two-dimensional projection of a three-dimensional (3D) object. The 3D reconstruction of the object can be calculated from a series of projections by back-projection, but this algorithm assumes that the image is linearly related to a line integral of the object function. However, there are two kinds of contrast in electron microscopy, scattering and phase contrast, of which only the latter is linear with the optical density (OD) in the micrograph. Therefore the OD can be used as a measure of the projection only for thin specimens where phase contrast dominates the image. For thick specimens, where scattering contrast predominates, an exponential absorption law holds, and a logarithm of OD must be used. However, for large thicknesses, the simple exponential law might break down due to multiple and inelastic scattering.

An Image Reconstruction System Applied to High Voltage Microscopy

1975 ◽  
Vol 33 ◽  
pp. 292-293
Author(s):  
D. E. Johnson
Keyword(s):  
High Voltage ◽  
Prior Information ◽  
Block Diagram ◽  
Three Dimensional ◽  
Real Space ◽  
Two Dimensional ◽  
Efficient Manner ◽  
Fourier Methods ◽  
Tilt Series ◽  
Methods Of Reconstruction

Increased specimen penetration; the principle advantage of high voltage microscopy, is accompanied by an increased need to utilize information on three dimensional specimen structure available in the form of two dimensional projections (i.e. micrographs). We are engaged in a program to develop methods which allow the maximum use of information contained in a through tilt series of micrographs to determine three dimensional speciman structure.In general, we are dealing with structures lacking in symmetry and with projections available from only a limited span of angles (±60°). For these reasons, we must make maximum use of any prior information available about the specimen. To do this in the most efficient manner, we have concentrated on iterative, real space methods rather than Fourier methods of reconstruction. The particular iterative algorithm we have developed is given in detail in ref. 3. A block diagram of the complete reconstruction system is shown in fig. 1.

Computer Assisted Image Reconstruction of Oligomer Structure

1976 ◽  
Vol 34 ◽  
pp. 472-473
Author(s):  
A.M. Jones ◽  
A. Max Fiskin
Keyword(s):  
Three Dimensional ◽  
Depth Of Field ◽  
Computer Assisted ◽  
Projection Data ◽  
Two Dimensional ◽  
Single Particles ◽  
Dimensional Reconstruction ◽  
Computer Assisted Image ◽  
The Fourier Transform ◽  
Space Approach

If the tilt of a specimen can be varied either by the strategy of observing identical particles orientated randomly or by use of a eucentric goniometer stage, three dimensional reconstruction procedures are available (l). If the specimens, such as small protein aggregates, lack periodicity, direct space methods compete favorably in ease of implementation with reconstruction by the Fourier (transform) space approach (2). Regardless of method, reconstruction is possible because useful specimen thicknesses are always much less than the depth of field in an electron microscope. Thus electron images record the amount of stain in columns of the object normal to the recording plates. For single particles, practical considerations dictate that the specimen be tilted precisely about a single axis. In so doing a reconstructed image is achieved serially from two-dimensional sections which in turn are generated by a series of back-to-front lines of projection data.

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