A new Fourier-related double scale analysis for wrinkling analysis of thin films on compliant substrates

2017 ◽  
Vol 160 ◽  
pp. 613-624 ◽  
Author(s):  
Qun Huang ◽  
Jie Yang ◽  
Wei Huang ◽  
Yin Liu ◽  
Heng Hu ◽  
...  
Keyword(s):  
Thin Films ◽  
Scale Analysis ◽  
Compliant Substrates ◽  
Wrinkling Analysis ◽  
Double Scale

scholarly journals Multiple bifurcations in wrinkling analysis of thin films on compliant substrates

2015 ◽  
Vol 76 ◽  
pp. 203-222 ◽  
Author(s):  
Fan Xu ◽  
Michel Potier-Ferry ◽  
Salim Belouettar ◽  
Heng Hu
Keyword(s):  
Thin Films ◽  
Compliant Substrates ◽  
Wrinkling Analysis

A two-dimensional Fourier-series finite element for wrinkling analysis of thin films on compliant substrates

2017 ◽  
Vol 114 ◽  
pp. 144-153 ◽  
Author(s):  
Qun Huang ◽  
Rui Xu ◽  
Yin Liu ◽  
Heng Hu ◽  
Gaetano Giunta ◽  
...  
Keyword(s):  
Thin Films ◽  
Finite Element ◽  
Fourier Series ◽  
Two Dimensional ◽  
Compliant Substrates ◽  
Wrinkling Analysis

A new family of finite elements for wrinkling analysis of thin films on compliant substrates

2015 ◽  
Vol 119 ◽  
pp. 568-577 ◽  
Author(s):  
Jie Yang ◽  
Qun Huang ◽  
Heng Hu ◽  
Gaetano Giunta ◽  
Salim Belouettar ◽  
...  
Keyword(s):  
Thin Films ◽  
Finite Elements ◽  
Compliant Substrates ◽  
New Family ◽  
Wrinkling Analysis

Evaluate the flammability of a PU foam with double-scale analysis

2018 ◽  
Vol 135 (6) ◽  
pp. 3329-3337 ◽  
Author(s):  
Qiang Xu ◽  
Cong Jin ◽  
Andrea Majlingova ◽  
Martin Zachar ◽  
Agoston Restas
Keyword(s):  
Scale Analysis ◽  
Pu Foam ◽  
Double Scale

scholarly journals Proposition of a First-Principles Aided Triple-Scale Analysis for Biocompatible Piezoelectric Thin Films

2008 ◽  
Vol 74 (747) ◽  
pp. 1405-1410 ◽  
Author(s):  
Yasutomo UETSUJI ◽  
Hwishim HWANG ◽  
Sei-ichiro SAKATA ◽  
Kazuyoshi TSUCHIYA ◽  
Eiji NAKAMACHI
Keyword(s):  
Thin Films ◽  
First Principles ◽  
Scale Analysis ◽  
Piezoelectric Thin Films

Controlled wrinkling analysis of thin films on gradient substrates

2017 ◽  
Vol 38 (5) ◽  
pp. 617-624 ◽  
Author(s):  
Jianzhong Zhao ◽  
Xingming Guo ◽  
Lu Lu
Keyword(s):  
Thin Films ◽  
Wrinkling Analysis

X-ray probe of GaN thin films grown on InGaN compliant substrates

2013 ◽  
Vol 102 (13) ◽  
pp. 132104
Author(s):  
Xiaoqing Xu ◽  
Yang Li ◽  
Jianming Liu ◽  
Hongyuan Wei ◽  
Xianglin Liu ◽  
...  
Keyword(s):  
Thin Films ◽  
X Ray ◽  
Compliant Substrates
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