Large reduction in electrical contact resistance of flexible carbon nanotube/silicone rubber composites by trifluoroacetic acid treatment

2017 ◽  
Vol 143 ◽  
pp. 98-105 ◽  
Author(s):  
Sang-Eui Lee ◽  
Sang Soo Jee ◽  
Hyokeun Park ◽  
Sung-Hoon Park ◽  
Intaek Han ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Contact Resistance ◽  
Silicone Rubber ◽  
Trifluoroacetic Acid ◽  
Acid Treatment ◽  
Electrical Contact ◽  
Large Reduction ◽  
Rubber Composites ◽  
Electrical Contact Resistance

Effects of a carbon nanotube layer on electrical contact resistance between copper substrates

2006 ◽  
Vol 17 (9) ◽  
pp. 2294-2303 ◽  
Author(s):  
Myounggu Park ◽  
Baratunde A Cola ◽  
Thomas Siegmund ◽  
Jun Xu ◽  
Matthew R Maschmann ◽  
...  
Keyword(s):  
Carbon Nanotube ◽  
Contact Resistance ◽  
Electrical Contact ◽  
Electrical Contact Resistance

Electrical Contact Resistance at the Carbon Nanotube/Pd and Carbon Nanotube/Al Interfaces in End-Contact by First-Principles Calculations

2011 ◽  
Vol 133 (2) ◽  
Author(s):  
Feng Gao ◽  
Jianmin Qu ◽  
Matthew Yao
Keyword(s):  
Electronic Structure ◽  
Carbon Nanotube ◽  
Contact Resistance ◽  
Density Functional ◽  
Electrical Contact ◽  
Electrical Contact Resistance ◽  
Functional Theory ◽  
Single Walled Carbon Nanotube ◽  
Current Voltage ◽  
Current Voltage Relation

Reported in this paper is a quantum mechanics study on the electronic structure and contact resistance at the interfaces formed when an open-end single-walled carbon nanotube (CNT) is in end-contact with aluminum (Al) and palladium (Pd), respectively. The electronic structures are computed using a density functional theory (DFT), and the transmission coefficient is calculated using a nonequilibrium Green’s function (NEGF) in conjunction with the DFT. The current–voltage relation of the simulating cell is obtained by using the Landauer–Buttiker formula, from which the contact resistance can be determined. Our results show that the electronic structure and electron transport behavior are strongly dependent on the electrode. It is found that the CNT/Pd interface has a weaker bond than the CNT/Al interface. However, the CNT/Pd interface shows a lower electrical contact resistance.

Discrete drops in the electrical contact resistance during nanoindentation of a bulk metallic glass

2016 ◽  
Vol 108 (18) ◽  
pp. 181903 ◽  
Author(s):  
Gaurav Singh ◽  
R. L. Narayan ◽  
A. M. Asiri ◽  
U. Ramamurty
Keyword(s):  
Metallic Glass ◽  
Contact Resistance ◽  
Bulk Metallic Glass ◽  
Electrical Contact ◽  
Electrical Contact Resistance
Sign in / Sign up

Export Citation Format

Share Document