Effect of Al2O3 deposition on carrier mobility and ambient stability of few-layer MoS2 field effect transistors
2020 ◽
Vol 20
(2)
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pp. 363-365
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Keyword(s):
2014 ◽
Vol 35
(9)
◽
pp. 094007
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2006 ◽
Vol 45
(4B)
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pp. 3084-3087
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