Self-consistent charge-up simulation for the microscopic feature of SiO2 layer in rf capacitive discharge
2015 ◽
Vol 15
(11)
◽
pp. 1463-1471
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1999 ◽
Vol 173
◽
pp. 37-44
1990 ◽
Vol 48
(4)
◽
pp. 664-665
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