Electrical and dielectric properties of Al/HfO2/p-Si MOS device at high temperatures
2013 ◽
Vol 13
(8)
◽
pp. 1819-1825
◽
Keyword(s):
2014 ◽
Vol 62
(10)
◽
pp. 2456-2461
◽
2017 ◽
Vol 724
◽
pp. 951-958
◽