A spectroscopic ellipsometry study of TiO2 thin films prepared by ion-assisted electron-beam evaporation

2009 ◽  
Vol 9 (3) ◽  
pp. 707-712 ◽  
Author(s):  
Pitak Eiamchai ◽  
Pongpan Chindaudom ◽  
Artorn Pokaipisit ◽  
Pichet Limsuwan
2010 ◽  
Vol 257 (4) ◽  
pp. 1149-1153 ◽  
Author(s):  
Min Wook Pyun ◽  
Eui Jung Kim ◽  
Dae-Hwang Yoo ◽  
Sung Hong Hahn

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