Real-time stress analysis of low-temperature Ge nanodot growth on H-terminated Si(111) 1×1 and Si(111) 7×7 surfaces
2008 ◽
Vol 8
(3-4)
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pp. 246-248
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1986 ◽
Vol 52
(478)
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pp. 1553-1558
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2018 ◽
Vol 295
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pp. 012024
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2017 ◽
Vol 148
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pp. 81-90
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