Three-dimensional imaging of collagen fibril organization in rat circumferential lamellar bone using a dual beam electron microscope reveals ordered and disordered sub-lamellar structures

Bone ◽  
2013 ◽  
Vol 52 (2) ◽  
pp. 676-683 ◽  
Author(s):  
Natalie Reznikov ◽  
Rotem Almany-Magal ◽  
Ron Shahar ◽  
Steve Weiner
Keyword(s):  
Electron Microscope ◽  
Collagen Fibril ◽  
Three Dimensional ◽  
Lamellar Bone ◽  
Three Dimensional Imaging ◽  
Beam Electron ◽  
Lamellar Structures ◽  
Dual Beam

scholarly journals Three-Dimensional Spatial Distribution of Synapses in the Neocortex: A Dual-Beam Electron Microscopy Study

2013 ◽  
Vol 24 (6) ◽  
pp. 1579-1588 ◽  
Author(s):  
Angel Merchán-Pérez ◽  
José-Rodrigo Rodríguez ◽  
Santiago González ◽  
Víctor Robles ◽  
Javier DeFelipe ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Spatial Distribution ◽  
Three Dimensional ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Beam Electron ◽  
Dual Beam

Morphology and Chemical Composition of Silicon Carbide Surfaces Interacting with Iron, Cobalt, and Nickel in Microscratching

2018 ◽  
Vol 284 ◽  
pp. 363-368 ◽  
Author(s):  
V.A. Nosenko ◽  
A.V. Fetisov ◽  
V.Ye. Puzyrkova
Keyword(s):  
Silicon Carbide ◽  
Electron Microscope ◽  
Chemical Composition ◽  
Iron Cobalt ◽  
Beam Electron ◽  
X Ray ◽  
Metal Atoms ◽  
Dual Beam ◽  
Structure Of Metal ◽  
Cobalt And Nickel

The paper dwells upon the specifics of worn spots being formed on a silicon-carbide crystal in microscratching of iron, cobalt, and nickel. Analysis was done using a Versa 3D dual-beam electron microscope. The chemical composition of worn spots was studied by local X-ray microanalysis. It was found out that the amount of metal transferred to the silicon-carbide worn spot was associated with the electron structure of metal atoms.

A Study on Plastic Deformations due to Contact Fatigue Wear on a Metallic Coating Deposed in Electric Arc

2013 ◽  
Vol 837 ◽  
pp. 9-15
Author(s):  
Gică Narcis Băsescu ◽  
Ionuț Vasile Crîșmaru ◽  
Sorin Iacob Strugaru ◽  
Andreea Carmen Bărbînţă ◽  
Alexandru Bârcă ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Contact Fatigue ◽  
Base Material ◽  
Electric Arc ◽  
Fatigue Wear ◽  
Plastic Deformations ◽  
Contact Materials ◽  
Beam Electron ◽  
Dual Beam ◽  
Lubrication Conditions

This paper studies the way how a sample with a 40Cr130 coating behaves to contact fatigue wear from the perspective of plastic deformations. The sample is made of an 18MnCr11 alloy steel. The coating was deposited in electric arc using the Smart Arc 350 installation from Sulzer Metco. The samples was subjected to fatigue wear on the AMSLER installation in limit and mixed lubrication conditions. The samples were subjected to wear for 30 hours, at a loading force of 177 N. The moving sample had a rotational speed of 375 rot/min. Different combinations of contact materials were used for the test samples: coating coating and coating base material. The results were highlighted using the QUANTA 200 3D DUAL BEAM electron microscope.

Freeze-Fracture Replication in the Ultrastructure of Blue-Green Algae

1967 ◽  
Vol 25 ◽  
pp. 74-75
Author(s):  
L. V. Leak
Keyword(s):  
Cell Wall ◽  
Electron Microscope ◽  
Green Algae ◽  
Three Dimensional ◽  
Freeze Fracture ◽  
Electron Microscopic ◽  
Photosynthetic Membranes ◽  
Blue Green Algae ◽  
Cell Biol ◽  
Cellular Components

Electron microscopic observations of freeze-fracture replicas of Anabaena cells obtained by the procedures described by Bullivant and Ames (J. Cell Biol., 1966) indicate that the frozen cells are fractured in many different planes. This fracturing or cleaving along various planes allows one to gain a three dimensional relation of the cellular components as a result of such a manipulation. When replicas that are obtained by the freeze-fracture method are observed in the electron microscope, cross fractures of the cell wall and membranes that comprise the photosynthetic lamellae are apparent as demonstrated in Figures 1 & 2.A large portion of the Anabaena cell is composed of undulating layers of cytoplasm that are bounded by unit membranes that comprise the photosynthetic membranes. The adjoining layers of cytoplasm are closely apposed to each other to form the photosynthetic lamellae. Occassionally the adjacent layers of cytoplasm are separated by an interspace that may vary in widths of up to several 100 mu to form intralamellar vesicles.

A Scanning Electron Microscope Study of Isolated Guard Cells

1973 ◽  
Vol 31 ◽  
pp. 454-455 ◽  
Author(s):  
P. Dayanandan ◽  
P. B. Kaufman
Keyword(s):  
Electron Microscope ◽  
Electron Microscope Study ◽  
Three Dimensional ◽  
Guard Cells ◽  
Scanning Electron Microscope Study ◽  
Psilotum Nudum ◽  
Subsidiary Cells ◽  
Welwitschia Mirabilis ◽  
Cycas Revoluta ◽  
Scanning Electron

A three dimensional appreciation of the guard cell morphology coupled with ultrastjuctural studies should lead to a better understanding of their still obscure dynamics of movement. We have found the SEM of great value not only in studies of the surface details of stomata but also in resolving the structures and relationships that exist between the guard and subsidiary cells. We now report the isolation and SEM studies of guard cells from nine genera of plants.Guard cells were isolated from the following plants: Psilotum nudum, four species of Equisetum, Cycas revoluta, Ceratozamia sp., Pinus sylvestris, Ephedra cochuma, Welwitschia mirabilis, Euphorbia tirucalli and Allium cepa.

A New 1000kv Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 100-101
Author(s):  
J.L. Williams ◽  
K. Heathcote ◽  
E.J. Greer
Keyword(s):  
Electron Microscope ◽  
Direct Observation ◽  
High Voltage ◽  
Three Dimensional ◽  
Dimensional Structure ◽  
Specimen Thickness ◽  
Voltage Electron ◽  
High Voltage Electron Microscope ◽  
Dynamic Experiments ◽  
Conventional Instrument

High Voltage Electron Microscope already offers exciting experimental possibilities to Biologists and Materials Scientists because the increased specimen thickness allows direct observation of three dimensional structure and dynamic experiments on effectively bulk specimens. This microscope is designed to give maximum accessibility and space in the specimen region for the special stages which are required. At the same time it provides an ease of operation similar to a conventional instrument.

Methods for making stereoslides and -prints, with freeze-etched olfactory epithelium as example

1984 ◽  
Vol 42 ◽  
pp. 704-705
Author(s):  
Bert Ph. M. Menco ◽  
Ido F. Menco ◽  
Frans L.T. Verdonk
Keyword(s):  
Electron Microscope ◽  
Olfactory Epithelium ◽  
Three Dimensional ◽  
Supporting Cell ◽  
Structural Features ◽  
Extensive Study ◽  
Sprague Dawley ◽  
Freezing Method ◽  
Respiratory Epithelia ◽  
Three Dimensional Presentation

Previously we presented an extensive study of the distributions of intramembranous particles of structures in apical surfaces of nasal olfactory and respiratory epithelia of the Sprague-Dawley rat. For the same structures these distributions were compared in samples which were i) chemically fixed and cryo-protected with glycerol before cryo-fixation, after excision, and ii)ultra-rapidly frozen by means of the slam-freezing method. Since a three-dimensional presentation markedly improves visualization of structural features micrographs were presented as stereopairs. Two exposures were made by tiling the sample stage of the electron microscope 6° in either direction with an eucentric goniometer. The negatives (Agfa Pan 25 Professional) were reversed with Kodak Technical Pan Film 2415 developed in D76 1:1. The prints were made from these reversed negatives. As an example tight-junctional features of an olfactory supporting cell in a region where this cell conjoined with two other cells are presented (Fig. 1).

Comparison of Conventional and Electron Spectroscopic Imaging in the Fixed Beam Electron Microscope of Ordered Protein Arrays

1985 ◽  
Vol 43 ◽  
pp. 74-75
Author(s):  
E. L. Buhle ◽  
U. Aebi
Keyword(s):  
Image Processing ◽  
Electron Microscope ◽  
High Resolution ◽  
Image Plane ◽  
Electron Spectroscopic Imaging ◽  
Protein Arrays ◽  
Beam Electron ◽  
Average Unit ◽  
Fixed Beam ◽  
Energy Components

CTEM brightfield images are formed by a combination of relatively high resolution elastically scattered electrons and unscattered and inelastically scattered electrons. In the case of electron spectroscopic images (ESI), the inelastically scattered electrons cause a loss of both contrast and spatial resolution in the image. In the case of ESI imaging on the Zeiss EM902, the transmited electrons are dispersed into their various energy components by passing them through a magnetic prism spectrometer; a slit is then placed in the image plane of the prism to select the electrons of a given energy loss for image formation. The purpose of this study was to compare CTEM with ESI images recorded on a Zeiss EM902 of ordered protein arrays. Digital image processing was employed to analyze the average unit cell morphologies of the two types of images.

Sign in / Sign up

Export Citation Format

Share Document