Dual-functional porous copper films modulated via dynamic hydrogen bubble template for in situ SERS monitoring electrocatalytic reaction

2019 ◽  
Vol 494 ◽  
pp. 731-739 ◽  
Author(s):  
Hui Yang ◽  
Xin Hao ◽  
Jia Tang ◽  
Wei Jin ◽  
Changqing Liu ◽  
...  
2013 ◽  
Vol 25 (17) ◽  
pp. 9927-9930 ◽  
Author(s):  
Binbin Luo ◽  
Xueming Li ◽  
Xianli Li ◽  
Wenlin Feng

2021 ◽  
Vol MA2021-02 (19) ◽  
pp. 704-704
Author(s):  
Jonathan Schoenleber ◽  
Baptiste Fedi ◽  
Marie-Pierre Gigandet ◽  
Jean-Yves Hihn

2007 ◽  
Vol 19 (23) ◽  
pp. 5758-5764 ◽  
Author(s):  
Ying Li ◽  
Wen-Zhi Jia ◽  
Yan-Yan Song ◽  
Xing-Hua Xia

Author(s):  
Mohamed R. Rizk ◽  
Muhammad G. Gamal ◽  
Amina Mazhar ◽  
Mohamed El-Deab ◽  
Bahgat El-Anadouli

In this work, we report a single-step preparation of porous Ni-based foams thin layer atop Cu substrate via a facile dynamic hydrogen bubble template technique (DHBT). The prepared porous Ni-based...


2020 ◽  
Vol 46 (11) ◽  
pp. 17461-17468 ◽  
Author(s):  
Haibin Sun ◽  
Li'na Xu ◽  
Jiao Li ◽  
Yan'an Li ◽  
Tong Wu ◽  
...  

1996 ◽  
Vol 436 ◽  
Author(s):  
R.-M. Keller ◽  
W. Sigle ◽  
S. P. Baker ◽  
O. Kraft ◽  
E. Arzt

AbstractIn-situ transmission electron microscopy (TEM) was performed to study grain growth and dislocation motion during temperature cycles of Cu films with and without a cap layer. In addition, the substrate curvature method was employed to determine the corresponding stresstemperature curves from room temperature up to 600°C. The results of the in-situ TEM investigations provide insight into the microstructural evolution which occurs during the stress measurements. Grain growth occurred continuously throughout the first heating cycle in both cases. The evolution of dislocation structure observed in TEM supports an explanation of the stress evolution in both capped and uncapped films in terms of dislocation effects.


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