The impact of thickness on the optical, electrical and dielectric properties of nanocrystalline 0.9 MTO-0.1BNO composite thin films

2019 ◽  
Vol 489 ◽  
pp. 831-840
Author(s):  
Susmita Rabha ◽  
Pamu Dobbidi
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Composite Thin Films ◽  
Electrical And Dielectric Properties ◽  
The Impact

scholarly journals Estimation of The Electrical and Dielectric Properties For Se98Te2 and Se96Te2X2 (X = Zn and Cd) Amorphous Films.

2021 ◽  
Author(s):  
Amira Shakra ◽  
M. Fadel ◽  
A.E. Kalila
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Conduction Mechanism ◽  
Charge Carriers ◽  
Amorphous Films ◽  
Thermal Evaporation Method ◽  
Cbh Model ◽  
X Ray ◽  
Electrical And Dielectric Properties ◽  
Quenching Method

Abstract Bulk glassy Se98Te2 and Se96Te2X2 (X = Zn and Cd) were prepared by melting quenching method. Thin films of various thicknesses (200 – 670 nm) were obtained by the thermal evaporation method. The structure of the prepared compositions was investigated by X-ray and EDX analysis. We studied the effect of Zn and Cd addition on the electric and dielectric properties of Se98Te2 thin films. Our measurements were studied in the temperature range (298-323K) below the glass transition temperature and frequency range (100 Hz-1 MHz). DC conductivity showed a single conduction mechanism by hopping of charge carriers at the band edges for the studied system. The dependence of Ac conductivity on frequency is linear with frequency exponent s lies very close to unit and is independent of temperature. This can be explained by the correlated barrier hopping (CBH) model. The dielectric constant ε1 and dielectric loss ε2 noticed to decrease with frequency and increase with temperature. The maximum barrier height Wm was calculated according to Guinitin.

scholarly journals Dielectric and electrical properties of annealed ZnS thin films. The appearance of the OLPT conduction mechanism in chalcogenides

RSC Advances ◽  
2020 ◽  
Vol 10 (16) ◽  
pp. 9549-9562 ◽  
Author(s):  
J. Koaib ◽  
N. Bouguila ◽  
H. Abassi ◽  
N. Moutia ◽  
M. Kraini ◽  
...  
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Electrical Properties ◽  
Conduction Mechanism ◽  
Annealing Temperature ◽  
Electrical And Dielectric Properties

The annealing temperature (Ta) dependence of the structural, morphological, electrical and dielectric properties of ZnS thin films was investigated.

Conductivity and dielectric properties of PEDOT-PSS doped DMSO nano composite thin films

2016 ◽  
Vol 27 (8) ◽  
pp. 8332-8339 ◽  
Author(s):  
Apsar Pasha ◽  
Aashis S. Roy ◽  
M. V. Murugendrappa ◽  
Omar A. Al-Hartomy ◽  
Syed Khasim
Keyword(s):  
Thin Films ◽  
Dielectric Properties ◽  
Nano Composite ◽  
Composite Thin Films
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