In-situ study of surface structure evolution of silicon anodes by electrochemical atomic force microscopy

2018 ◽  
Vol 452 ◽  
pp. 67-74 ◽  
Author(s):  
Shiqiang Huang ◽  
Ling-Zhi Cheong ◽  
Shuwei Wang ◽  
Deyu Wang ◽  
Cai Shen
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Structure ◽  
Structure Evolution ◽  
Force Microscopy ◽  
Silicon Anodes ◽  
In Situ Study ◽  
Atomic Force

In Situ Measurement of Solid Electrolyte Interphase Evolution on Silicon Anodes Using Atomic Force Microscopy

2016 ◽  
Vol 6 (12) ◽  
pp. 1600099 ◽  
Author(s):  
Insun Yoon ◽  
Daniel P. Abraham ◽  
Brett L. Lucht ◽  
Allan F. Bower ◽  
Pradeep R. Guduru
Keyword(s):  
Atomic Force Microscopy ◽  
Solid Electrolyte ◽  
Solid Electrolyte Interphase ◽  
In Situ Measurement ◽  
Force Microscopy ◽  
Silicon Anodes ◽  
Atomic Force

Investigation of the Surface Morphology of a-Si:H by Atomic Force Microscopy and In-Situ Ellipsometry

1995 ◽  
Vol 377 ◽  
Author(s):  
H. N. Wanka ◽  
A. Hierzenberger ◽  
M. B. Schubert
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Structure ◽  
Crystalline Silicon ◽  
Fused Silica ◽  
Silicon Wafers ◽  
Film Deposition ◽  
Native Oxide Layer ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTCombining real-time ellipsometry and atomic force microscopy (AFM) the growth of hydrogenated amorphous silicon (a-Si:H), deposited on crystalline silicon wafers with a native oxide layer on top and on fused silica from a dc glow discharge, has been studied from initial nucleation to the final morphology. By in-situ ellipsometry we detected the evolution of morphology changes. The surface structure has been determined by AFM in the nucleation phase and in the subsequent growth stage. During nucleation on crystalline silicon only few (about 40 per 1μm) flat islands of a-Si:H (up to 4 nm high and up to 50 nm in diameter) grow with a strongly enhanced rate compared to bulk deposition. Once the crystalline surface has completely been covered by a-Si:H, the fast deposition of these islands stops and further surface structures, comparable with the initial ones, start to grow gradually until a homogeneous final roughness up to 5nm high is formed. Nucleation of a-Si:H on fused silica yields densely distributed nuclei (up to 1.5 nm high and up to 25 nm in diameter), indicating a shorter surface diffusion length on this substrate compared to the growth on silicon wafers. The ongoing film deposition, however, finally results in a morphology comparable to the one of a-Si:H grown on crystalline silicon. Using hydrogen dilution we found that the final roughness is affected by the dilution ratio; furthermore infrared spectroscopy reveals the surface structure to be correlated with the hydrogen content of the a-Si:H films.

An in Situ Study of Metal Complexation by an Immobilized Synthetic Biopolymer Using Tapping Mode Liquid Cell Atomic Force Microscopy

2001 ◽  
Vol 73 (17) ◽  
pp. 4087-4095 ◽  
Author(s):  
Thomasin C. Miller ◽  
Eun-Soo Kwak ◽  
Maury E. Howard ◽  
David A. Vanden Bout ◽  
James A. Holcombe
Keyword(s):  
Atomic Force Microscopy ◽  
Metal Complexation ◽  
Tapping Mode ◽  
Force Microscopy ◽  
In Situ Study ◽  
Atomic Force ◽  
Liquid Cell
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