scholarly journals Derivation of dielectric function and inelastic mean free path from photoelectron energy-loss spectra of amorphous carbon surfaces

2016 ◽  
Vol 387 ◽  
pp. 1125-1139 ◽  
Author(s):  
Denis David ◽  
Christian Godet
Keyword(s):  
Energy Loss ◽  
Free Path ◽  
Dielectric Function ◽  
Amorphous Carbon ◽  
Mean Free Path ◽  
Photoelectron Energy ◽  
Carbon Surfaces ◽  
Inelastic Mean Free Path

scholarly journals Determining Inelastic Mean Free Path by Electron Energy Loss Spectroscopy

2006 ◽  
Vol 12 (S02) ◽  
pp. 1186-1187 ◽  
Author(s):  
Q Jin ◽  
D Li
Keyword(s):  
Energy Loss ◽  
Free Path ◽  
Electron Energy ◽  
Electron Energy Loss Spectroscopy ◽  
Mean Free Path ◽  
Inelastic Mean Free Path ◽  
Electron Energy Loss

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

scholarly journals Inelastic mean free path of swift electrons and stopping power in Ta2O5

2018 ◽  
Vol 16 (37) ◽  
pp. 149-155
Author(s):  
Ishraq Ahmed Shakir
Keyword(s):  
Energy Loss ◽  
Free Path ◽  
Cross Section ◽  
Loss Function ◽  
Average Distance ◽  
Mean Free Path ◽  
Stopping Power ◽  
Energy Loss Function ◽  
Inelastic Mean Free Path ◽  
Good Agreement

Energy Loss Function (ELF) of 2 5 Ta O derived from optical limitand extended to the total part of momentum and their energyexcitation region ELF plays an important function in calculatingenergy loss of electron in materials. The parameter Inelastic MeanFree Path (IMFP) is most important in quantitative surface sensitiveelectron spectroscopies, defined as the average distance that anelectron with a given energy travels between successive inelasticcollisions. The stopping cross section and single differential crosssectionSDCS are also calculated and gives good agreement withprevious work.

Parameterization of the mean free path for inelastic scattering of fast electrons

1987 ◽  
Vol 45 ◽  
pp. 122-123
Author(s):  
R. F. Egerton ◽  
S. C. Cheng ◽  
T. Malis
Keyword(s):  
Energy Loss ◽  
Free Path ◽  
Mean Free Path ◽  
Fast Electrons ◽  
Before And After ◽  
The Mean ◽  
Convergent Beam ◽  
Inelastic Mean Free Path ◽  
Electron Energy Loss ◽  
Beam Diffraction

The areas, Iz and It, under the zero-loss peak and under the entire energy-loss spectrum (of a sample of thickness t) are related by the formula:t/ƛ(β) = ln (It/Iz) (1)where ƛ(β) is the inelastic mean free path for all energy losses and for scattering into the collection aperture, of semiangle β. We have used Eq.(l) to experimentally determine ƛ(β) by electron energy-loss spectroscopy of specimens of known composition and thickness. In the case of crystalline samples, the local thickness t was measured by convergent-beam diffraction. In the case of evaporated thin-film specimens, the average thickness was obtained by accurately weighing the substrate before and after deposition. The energy-loss spectroscopy was carried out in CTEM mode with incident energies Eo between 20keV and 120keV, and with collection semiangles in the range 0.2 mrad to 100 mrad.

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