Electrochromic properties and performance of NiOx films and their corresponding all-thin-film flexible devices preparedby reactive DC magnetron sputtering

2016 ◽  
Vol 383 ◽  
pp. 49-56 ◽  
Author(s):  
Dongmei Dong ◽  
Wenwen Wang ◽  
Guobo Dong ◽  
Fan Zhang ◽  
Yingchun He ◽  
...  
2018 ◽  
Vol 5 (1) ◽  
pp. 2696-2704 ◽  
Author(s):  
M. Muralidhar Singh ◽  
G. Vijaya ◽  
M.S. Krupashankara ◽  
B.K. Sridhara ◽  
T.N. Shridhar

2018 ◽  
Vol 18 (6) ◽  
pp. 4222-4229 ◽  
Author(s):  
Jianhua Qiu ◽  
Zhao Chen ◽  
Tianxiang Zhao ◽  
Zhihui Chen ◽  
Wenjing Chu ◽  
...  

2017 ◽  
Vol 4 (5) ◽  
pp. 6466-6471 ◽  
Author(s):  
Kittikhun Seawsakul ◽  
Mati Horprathum ◽  
Pitak Eiamchai ◽  
Viyapol Pattantsetakul ◽  
Saksorn Limwichean ◽  
...  

2013 ◽  
Vol 802 ◽  
pp. 47-52
Author(s):  
Chuleerat Ibuki ◽  
Rachasak Sakdanuphab

In this work the effects of amorphous (glass) and crystalline (Si) substrates on the structural, morphological and adhesion properties of CoFeB thin film deposited by DC Magnetron sputtering were investigated. It was found that the structure of a substrate affects to crystal formation, surface morphology and adhesion of CoFeB thin films. The X-Ray diffraction patterns reveal that as-deposited CoFeB thin film at low sputtering power was amorphous and would become crystal when the power increased. The increase in crystalline structure of CoFeB thin film is attributed to the crystalline substrate and the increase of kinetic energy of sputtering atoms. Atomic Force Microscopy images of CoFeB thin film clearly show that the roughness, grain size, and uniformity correlate to the sputtering power and the structure of substrate. The CoFeB thin film on glass substrate shows a smooth surface and a small grain size whereas the CoFeB thin film on Si substrate shows a rough surface and a slightly increases of grain size. Sticky Tape Test on CoFeB thin film deposited on glass substrate indicates the adhesion failure with a high sputtering power. The results suggest that the crystalline structure of substrate affects to the atomic bonding and the sputtering power affects to intrinsic stress of CoFeB thin film.


Author(s):  
Muralidhar Singh M ◽  
Vijaya G ◽  
Krupashankara MS ◽  
B K Sridhara ◽  
T N Shridhar

2011 ◽  
Vol 40 (9) ◽  
pp. 1342-1345
Author(s):  
王震东 王震东 ◽  
赖珍荃 赖珍荃 ◽  
范定环 范定环 ◽  
徐鹏 徐鹏

Vacuum ◽  
2004 ◽  
Vol 74 (3-4) ◽  
pp. 723-727 ◽  
Author(s):  
N. Kanai ◽  
T. Nuida ◽  
K. Ueta ◽  
K. Hashimoto ◽  
T. Watanabe ◽  
...  

2011 ◽  
Vol 675-677 ◽  
pp. 1097-1100
Author(s):  
W. Wu ◽  
X.H. Xiao ◽  
T.C. Peng ◽  
C.Z. Jiang

A novel spindle-like zinc oxide (ZnO) nanocrystalline thin film was successfully fabricated on Ni thin film layer by ultrahigh-vacuum dc magnetron sputtering. Then the as-grown films were annealed in air at various temperatures from 673 to 1073 K, the corresponding structural features and surface morphology were studied by X-ray diffraction (XRD) and field emission scanning electronic microscopy (FE-SEM). The results reveal that the dominant direction of grains movement changed from perpendicular to parallel to the film interfaces. A correlation of the band gap and photoluminescence (PL) properties of nanocrystalline ZnO films with particle size morphologies and strain was discussed. Especially, PL emission in UV range, which is due to near band edge emission is more intense in comparison with the green band emission (due to defect state) was observed in all samples, indicating a good optical quality of the deposited films.


2013 ◽  
Vol 13 (10) ◽  
pp. 7152-7154 ◽  
Author(s):  
Jung-Pil Noh ◽  
Ki-Taek Jung ◽  
Min-Sun Jang ◽  
Tae-Hoon Kwon ◽  
Gyu-Bong Cho ◽  
...  

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